From post

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed.

 

Другие публикации лиц с тем же именем

Minimizing the cost of repairing WSI memories., и . Integr., 11 (3): 279-293 (1991)Reversible Gates and Testability of One Dimensional Arrays of Molecular QCA., , , и . J. Electron. Test., 24 (1-3): 297-311 (2008)Design and Performance Evaluation of Radiation Hardened Latches for Nanoscale CMOS., , и . IEEE Trans. Very Large Scale Integr. Syst., 19 (7): 1315-1319 (2011)Multiple Error Detection in DNA Self-Assembly Using Coded Tiles., , и . IEEE Trans. Circuits Syst. II Express Briefs, 57-II (9): 725-729 (2010)Reliability and Criticality Analysis of Communication Networks by Stochastic Computation., , , и . IEEE Netw., 30 (6): 70-76 (2016)Detection of Limited Magnitude Errors in Emerging Multilevel Cell Memories by One-Bit Parity (OBP) or Two-Bit Parity (TBP)., , и . IEEE Trans. Emerg. Top. Comput., 9 (4): 1792-1802 (2021)An Inexact Newton Method For Unconstrained Total Variation-Based Image Denoising by Approximate Addition., , , и . IEEE Trans. Emerg. Top. Comput., 10 (2): 1192-1207 (2022)Analysis and measurement of timing jitter induced by radiated EMI noise in automatic test equipment., , , , , , , и . IEEE Trans. Instrumentation and Measurement, 52 (6): 1749-1755 (2003)Modeling and analysis of fault tolerant multistage interconnection networks., , и . IEEE Trans. Instrumentation and Measurement, 52 (5): 1509-1519 (2003)Using Verilog VPI for Mixed Level Serial Fault Simulation in a Test Generation Environment., , и . Embedded Systems and Applications, стр. 139-143. CSREA Press, (2003)