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Disambiguation of "Singh, Adit D."

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Binning for IC Quality: Experimental Studies on the SEMATECH Data.

, , , and . DFT, page 4-10. IEEE Computer Society, (1998)

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Adit Ranadive

Somak Aditya

Dendy Adityawarman

Noviandi Meta Adityawarman

Raminder Singh

 

Other publications of authors with the same name

Exploring the Mysteries of System-Level Test., , , , , , , , , and . ATS, page 1-6. IEEE, (2020)A Secure Low-Cost Edge Device Authentication Scheme for the Internet of Things., , , , and . VLSID, page 85-90. IEEE Computer Society, (2018)Statistical Estimation of Correlated Leakage Power Variation and Its Application to Leakage-Aware Design., , , , and . VLSI Design, page 606-612. IEEE Computer Society, (2006)Probabilistic Self-Adaptation of Nanoscale CMOS Circuits: Yield Maximization under Increased Intra-Die Variations., , , , and . VLSI Design, page 711-716. IEEE Computer Society, (2007)Adapting to adaptive testing., , , , , , , , and . DATE, page 556-561. IEEE Computer Society, (2010)Leveraging Partially Enhanced Scan for Improved Observability in Delay Fault Testing., , , and . Asian Test Symposium, page 237-240. IEEE Computer Society, (2009)Distinguishing Resistive Small Delay Defects from Random Parameter Variations., and . Asian Test Symposium, page 325-330. IEEE Computer Society, (2010)Relating Yield Models to Burn-In Fall-Out in Time., and . ITC, page 77-84. IEEE Computer Society, (2003)An experimental evaluation of the differential BICS for IDDQ testing., and . VTS, page 472-485. IEEE Computer Society, (1995)Analysis of the die test optimization algorithm for negative binomial yield statistics., and . VTS, page 176-181. IEEE Computer Society, (1992)