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Electro-Thermal Limitations and Device Degradation of SiGe HBTs with Emphasis on Circuit Performance., , , , , , , , , and 1 other author(s). BCICTS, page 1-7. IEEE, (2021)Contribution to ageing simulation of complex analogue circuit using VHDL-AMS behavioural modelling language., , , and . Microelectron. Reliab., 42 (9-11): 1353-1358 (2002)La localisation en intérieur à l'aide de répéteurs GPS vers un système de positionnement universel?, , and . UbiMob, page 21-28. ACM, (2005)Influence of temperature of storage, write and read operations on multiple level cells NAND flash memories., , , , , , , and . Microelectron. Reliab., (2018)Relation between HCI-induced performance degradation and applications in a RISC processor., , , and . IOLTS, page 67-72. IEEE Computer Society, (2012)Advancements on reliability-aware analog circuit design., , , , , , , , , and . ESSCIRC, page 46-52. IEEE, (2012)Genetic algorithm optimisation for evanescent mode waveguide filter design., , , , and . ISCAS, page 411-414. IEEE, (2000)Design and implementation of a low cost test bench to assess the reliability of FPGA., and . Microelectron. Reliab., 55 (9-10): 1341-1345 (2015)Reliability of Low-Cost PCB Interconnections for Telecommunication Applications., , , , , and . Microelectron. Reliab., 44 (9-11): 1299-1304 (2004)Impact of SiGe HBT hot-carrier degradation on the broadband amplifier output supply current., , , , , and . ESSDERC, page 154-157. IEEE, (2019)