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Counter-Based Compaction: Delay and Stuck-Open Faults.

, и . IEEE Trans. Computers, 44 (6): 780-791 (1995)

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Monika Pilarski

Joachim Pilarski

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Slawomir Olszewski

 

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Notes on Multiple Input Signature Analysis., , и . IEEE Trans. Computers, 42 (2): 228-234 (1993)Circular Self-Test Path: A Low-Cost BIST Technique., и . DAC, стр. 407-415. IEEE Computer Society Press / ACM, (1987)SAT with partial clauses and back-leaps., и . DAC, стр. 743-746. ACM, (2002)Delay Fault Testing: How Robust are Our Models?, , , , и . VTS, стр. 502-503. IEEE Computer Society, (1996)Counter-Based Compaction: Delay and Stuck-Open Faults., и . IEEE Trans. Computers, 44 (6): 780-791 (1995)Comments on Äliasing Properties of Circular MISRs".. J. Electron. Test., 6 (1): 139-140 (1995)High Quality Testing of Embedded RAMs Using Circular Self-Test Path., и . ITC, стр. 652-661. IEEE Computer Society, (1992)A Novel Checkpointing Scheme for Distributed Database Systems., и . PODS, стр. 368-378. ACM Press, (1990)Quality considerations in delay fault testing., и . EURO-DAC, стр. 196-201. IEEE Computer Society, (1995)BIST and Delay Fault Detection., и . ITC, стр. 236-242. IEEE Computer Society, (1993)