( en | de | ru )

 

Disambiguation of "Ivanov, André"

Author of the publication

copydeleteadd this publication to your clipboard
Analog IP design flow for SoC applications.

, , , and . ISCAS (4), page 676-679. IEEE, (2003)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

Kostadin Ivanov

Evgenij Ivanov

Andrey Ivanov

Vitalii Ivanov

Daniela Ivanov

 

Other publications of authors with the same name

Guest Editorial.. J. Electron. Test., 19 (2): 101-102 (2003)Thermal Testing of Analogue Integrated Circuits: A Case Study., , and . J. Electron. Test., 19 (3): 353-357 (2003)Modeling and Evaluating Errors Due to Random Clock Shifts in Quantum-Dot Cellular Automata Circuits., , , , , , and . J. Electron. Test., 25 (1): 55-66 (2009)Fast detection of data retention faults and other SRAM cell open defects., , , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 25 (1): 167-180 (2006)Ring oscillators for functional and delay test of latches and flip-flops., , , and . SBCCI, page 67-72. ACM, (2011)Testability Measures : What Do They Do for ATPG ?, and . ITC, page 129-139. IEEE Computer Society, (1986)A new decompressor with ordered parallel scan design for reduction of test data and test time., , , and . ISCAS, page 641-644. IEEE, (2015)Effect of traffic localization on energy dissipation in NoC-based interconnect., , , , and . ISCAS (2), page 1774-1777. IEEE, (2005)Analog IP design flow for SoC applications., , , and . ISCAS (4), page 676-679. IEEE, (2003)Performance and functional test of flip-flops using ring oscillator structure., , and . IDT, page 42-47. IEEE, (2011)