( en | de | ru )

 

Disambiguation

From post

копироватьудалитьдобавить публикацию в буфер
Full-band tunable V-cavity laser for low-cost access and data center networks.

, , , , , , и . ICAIT, стр. 139-140. IEEE, (2013)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed.

Nikhilranjan Sen

Ramen Sen

Sen Ye

Parimal Sen

Miktat Sen

 

Другие публикации лиц с тем же именем

A Fractional Total Variational CNN Approach for SAR Image Despeckling., , , , и . ICIC (3), том 10956 из Lecture Notes in Computer Science, стр. 431-442. Springer, (2018)Residual compensation extreme learning machine for regression., , , и . Neurocomputing, (2018)Device-Free Localization via an Extreme Learning Machine with Parameterized Geometrical Feature Extraction., , , и . Sensors, 17 (4): 879 (2017)Data-driven prediction model for adjusting burden distribution matrix of blast furnace based on improved multilayer extreme learning machine., , , , и . Soft Comput., 22 (11): 3575-3589 (2018)Human Tracking for Daily Life Surveillance Based on a Wireless Sensor Network., и . WASA, том 7405 из Lecture Notes in Computer Science, стр. 677-684. Springer, (2012)An improved ELM algorithm for the measurement of hot metal temperature in blast furnace., , и . Neurocomputing, (2016)The Test Structure to Measure Polysilicon Seebeck Coefficient for Thermoelectric-Photoelectric Integrated Generator., и . NEMS, стр. 149-152. IEEE, (2019)Hybrid Grey Wolf Optimizer Using Elite Opposition-Based Learning Strategy and Simplex Method., , и . International Journal of Computational Intelligence and Applications, 16 (2): 1750012:1-1750012:37 (2017)Prediction model of permeability index for blast furnace based on the improved multi-layer extreme learning machine and wavelet transform., , , и . J. Frankl. Inst., 355 (4): 1663-1691 (2018)Using flower pollination algorithm and atomic potential function for shape matching., , , и . Neural Comput. Appl., 29 (6): 21-40 (2018)