( en | de | ru )

 

Disambiguation of "Lange, André"

Author of the publication

copydeleteadd this publication to your clipboard
Towards probabilistic analog behavioral modeling.

, , , , , and . ISCAS, page 2728-2731. IEEE, (2015)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

André Lange

Thomas André

Roger André

Günter André

Sabine André

 

Other publications of authors with the same name

Eigenschafts- und Modellbasierte Spezifikation: Ein Erfahrungsbericht., and . Grundlagen von Datenbanken, volume Bericht 94-01 of Universität Magdeburg, Forschungsbericht, page 127-131. Universität Magdeburg, (1994)Prediction of SRAM Reliability Under Mechanical Stress Induced by Harsh En§ironments., , , , , , , , , and 2 other author(s). ESSDERC, page 178-181. IEEE, (2018)Fitting standard cell performance to generalized Lambda distributions., , and . ACM Great Lakes Symposium on VLSI, page 259-264. ACM, (2011)Analysis of 28 nm SRAM cell stability under mechanical load applied by nanoindentation., , , , , , , , , and 3 other author(s). IRPS, page 5. IEEE, (2018)Hybrid dynamical systems for memristor modelling an approach avoiding the terminal-state problem., and . FDL, page 1-6. IEEE, (2013)Towards probabilistic analog behavioral modeling., , , , , and . ISCAS, page 2728-2731. IEEE, (2015)Probabilistic standard cell modeling considering non-Gaussian parameters and correlations., , , , , and . DATE, page 1-4. European Design and Automation Association, (2014)Supporting analog design for reliability by efficient provision of reliability information to designers., , , , and . DDECS, page 61-64. IEEE, (2023)Comparison of modeling approaches for transistor degradation: model card adaptations vs subcircuits., , , and . ESSDERC, page 186-189. IEEE, (2019)Non-Gaussian Correlated Multivariate Modeling for Variability Abstraction in Integrated Circuit Analysis (Mutlivariate Modellierung von Variationen für die Analyse Integrierter Schaltungen unter Berücksichtigung von nichtnormalverteilten korrelierten Größen). Technical University of Munich, Germany, (2016)