( en | de | ru )

 

Disambiguation of "Xie, Changsheng"

Author of the publication

copydeleteadd this publication to your clipboard
LUDA: Boost LSM Key Value Store Compactions with GPUs.

, , , , , , and . CoRR, (2020)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

Changsheng Liu

Changsheng Huang

Changsheng Zhao

Mingliang Xie

Jian Xie

 

Other publications of authors with the same name

Using Blocks Correlations to Improve the I/O Performance of Large Network Storage System., , , and . ISPA Workshops, volume 3759 of Lecture Notes in Computer Science, page 140-148. Springer, (2005)SmartRec: Fast Recovery from Single Failures in Heterogeneous RAID-Coded Storage Systems., , , and . Comput. J., 61 (6): 896-911 (2018)Data Migration in RAID Based on Stripe Unit Heat., , , and . ICMLC, volume 3930 of Lecture Notes in Computer Science, page 614-623. Springer, (2005)SMBSRP: A Search Mechanism Based on Interest Similarity, Query Relevance and Distance Prediction., , , and . IWANN (1), volume 7902 of Lecture Notes in Computer Science, page 633-646. Springer, (2013)EvoRAID: Adaptation to Dynamic Change of Disks in Storage System., , , and . HPCC, page 36-44. IEEE Computer Society, (2008)Fast block-matching motion estimation based on an improved cross-diamond search algorithm., , and . ICECS, page 1-4. IEEE, (2005)Real-Time Analysis for Wormhole NoC: Revisited and Revised., , , and . ACM Great Lakes Symposium on VLSI, page 75-80. ACM, (2016)Achieving High Reliability via Expediting the Repair of Critical Blocks in Replicated Storage Systems., , , , and . SRDS, page 61-70. IEEE Computer Society, (2016)Measuring and Analyzing Write Amplification Characteristics of Solid State Disks., , , and . MASCOTS, page 212-221. IEEE Computer Society, (2013)Error Generation for 3D NAND Flash Memory., , , , and . DATE, page 56-59. IEEE, (2022)