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Transitioning eMRAM from Pilot Project to Volume Production.

, , , , , , , , и . ITC, стр. 82-86. IEEE, (2023)

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Caroline Nadeau

Benoît Cordonnier

Non-Newtonian effects in silicate liquids and crystal bearing melts: implication for magma dynamics. Uni München, (2009)

Benoit Courmont

Benoît Mindzeng

David Benoit

 

Другие публикации лиц с тем же именем

MBIST Support for Reliable eMRAM Sensing., , , , и . ETS, стр. 1-6. IEEE, (2020)Power Aware Embedded Test., , , , , и . Asian Test Symposium, стр. 511-516. IEEE Computer Society, (2011)Memory repair logic sharing techniques and their impact on yield., и . ITC, стр. 1-5. IEEE, (2020)Configurable BISR Chain For Fast Repair Data Loading., и . ITC, стр. 56-62. IEEE, (2022)Complete, Contactless I/O Testing - Reaching the Boundary in Minimizing Digital IC Testing Cost., и . ITC, стр. 446-455. IEEE Computer Society, (2002)Built-In Self-Test: Assuring System Integrity., , , и . Computer, 29 (11): 39-45 (1996)Serial Interfacing for Embedded-Memory Testing., , и . IEEE Des. Test Comput., 7 (2): 52-63 (1990)Reducing Test Point Area for BIST through Greater Use of Functional Flip-Flops to Drive Control Points., , и . DFT, стр. 20-28. IEEE Computer Society, (2009)A New Hardware Fault Insertion Scheme for System Diagnostics Verification., , и . ITC, стр. 994-1002. IEEE Computer Society, (1995)Improved Core Isolation and Access for Hierarchical Embedded Test., , и . IEEE Des. Test Comput., 26 (1): 18-25 (2009)