( en | de | ru )

 

Disambiguation of "Dammann, Maximilian"

Author of the publication

copydeleteadd this publication to your clipboard
Reliability and Failure Analysis of 100 nm AlGaN/GaN HEMTs under DC and RF Stress.

, , , , , , , and . IRPS, page 1-7. IEEE, (2021)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

Ulrich Dammann

Alexander Dammann

Rolf Dammann

Günter Dammann

Jürgen Dammann

 

Other publications of authors with the same name

Comparison of reliability of 100 nm AlGaN/GaN HEMTs with T-gate and SAG-gate technology., , , , , , , and . Microelectron. Reliab., (2018)Reliability and Failure Analysis of 100 nm AlGaN/GaN HEMTs under DC and RF Stress., , , , , , , and . IRPS, page 1-7. IEEE, (2021)Critical factors influencing the voltage robustness of AlGaN/GaN HEMTs., , , , , , and . Microelectron. Reliab., 51 (2): 224-228 (2011)Sequential Atmospheric Pressure Plasma-Assisted Laser Ablation of Photovoltaic Cover Glass for Improved Contour Accuracy., , , and . Micromachines, 5 (3): 408-419 (2014)Reliability of 70 nm metamorphic HEMTs., , , , , , and . Microelectron. Reliab., 44 (6): 939-943 (2004)Reliability and degradation mechanism of AlGaN/GaN HEMTs for next generation mobile communication systems., , , , , , , , , and 6 other author(s). Microelectron. Reliab., 49 (5): 474-477 (2009)Degradation of 0.25 μm GaN HEMTs under high temperature stress test., , , , , , , , , and 4 other author(s). Microelectron. Reliab., 55 (9-10): 1667-1671 (2015)Influence of surface states on the voltage robustness of AlGaN/GaN HFET power devices., , , , , , , , and . Microelectron. Reliab., 54 (12): 2656-2661 (2014)High-voltage stress time-dependent dispersion effects in AlGaN/GaN HEMTs., , , , , , , , and . IRPS, page 2. IEEE, (2015)Reporting Strategy for VR Design Reviews., , , , and . HCI (46), volume 12428 of Lecture Notes in Computer Science, page 80-90. Springer, (2020)