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Cross-Correlation and Sine-Fitting Techniques for High-Resolution Ultrasonic Ranging.

, , , and . IEEE Trans. Instrum. Meas., 59 (12): 3227-3236 (2010)

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ADC interbit modulation: description, detection and quantification., and . Comput. Stand. Interfaces, 23 (1): 47-56 (2001)Cross-Correlation and Sine-Fitting Techniques for High-Resolution Ultrasonic Ranging., , , and . IEEE Trans. Instrum. Meas., 59 (12): 3227-3236 (2010)The use of a noise stimulus in ADC characterization., and . ICECS, page 457-460. IEEE, (1998)Influence of frequency errors in the variance of the cumulative histogram in ADC testing., and . IEEE Trans. Instrumentation and Measurement, 50 (2): 461-464 (2001)Variance of the cumulative histogram of ADCs due to frequency errors., and . IEEE Trans. Instrumentation and Measurement, 52 (1): 69-74 (2003)Overdrive in the ramp histogram test of ADCs., and . IEEE Trans. Instrumentation and Measurement, 54 (6): 2305-2309 (2005)Uncertainty of ADC random noise estimates obtained with the IEEE 1057 standard test., and . IEEE Trans. Instrumentation and Measurement, 54 (1): 110-116 (2005)A critical note to IEEE 1057-94 standard on hysteretic ADC dynamic testing., , and . IEEE Trans. Instrumentation and Measurement, 50 (4): 941-948 (2001)Automatic calibration of analog and digital measuring instruments using computer vision., and . IEEE Trans. Instrumentation and Measurement, 49 (1): 94-99 (2000)