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Relation between Reliability and Yield of IC's Based on Discrete Defect Distribution Model.

T. Zhao, Y. Hao, P. Ma, and T. Chen. DFT, page 48-. IEEE Computer Society, (2001)

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Peijun Shan

Peijun Mao

Yuzhao Ma

Characterization of higher order modes in optical fibersY. Ma. Uni Erlangen-Nürnberg, (2009)

Jingxiang Ma

Tsie Ma

Other publications of authors with the same name

Research on Technologies of Software Requirements Prioritization.Z. Tong, Q. Zhuang, Q. Guo, and P. Ma. ISCTCS, volume 426 of Communications in Computer and Information Science, page 9-21. Springer, (2013)SRNoC: A novel high performance Shared-Resource routing scheme for Network-on-Chip.H. Shu, P. Ma, J. Shi, Z. Xu, and L. Yang. Microelectron. J., 45 (8): 1103-1117 (2014)面向连续叠写的高精简中文手写识别方法研究 (Study on High Compact Recognition Method for Continuously Overlaid Chinese Handwriting).T. Su, H. Dai, J. Zhang, P. Ma, and S. Deng. 计算机科学, 42 (7): 300-304 (2015)Using Reduced Execution Flow Graph to Identify Library Functions in Binary Code.J. Qiu, X. Su, and P. Ma. IEEE Trans. Software Eng., 42 (2): 187-202 (2016)Efficient parametric yield optimization of VLSI circuit by uniform design sampling method.M. e Jing, Y. Hao, J. Zhang, and P. Ma. Microelectron. Reliab., 45 (1): 155-162 (2005)Entropy on interval-valued intuitionistic fuzzy sets and its application in multi-attribute decision making.Y. Zhang, P. Ma, X. Su, and C. Zhang. FUSION, page 1-7. IEEE, (2011)A new multi-target state estimation algorithm for PHD particle filter.L. Zhao, P. Ma, X. Su, and H. Zhang. FUSION, page 1-8. IEEE, (2010)Relation between Reliability and Yield of IC's Based on Discrete Defect Distribution Model.T. Zhao, Y. Hao, P. Ma, and T. Chen. DFT, page 48-. IEEE Computer Society, (2001)An efficient gene selection technique for cancer recognition based on neighborhood mutual information.Q. Hu, W. Pan, S. An, P. Ma, and J. Wei. Int. J. Mach. Learn. Cybern., 1 (1-4): 63-74 (2010)Identifying functions in binary code with reverse extended control flow graphs.J. Qiu, X. Su, and P. Ma. J. Softw. Evol. Process., 27 (10): 793-820 (2015)

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Disambiguation of "Ma, Peijun"

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Relation between Reliability and Yield of IC's Based on Discrete Defect Distribution Model.

Please choose a person to relate this publication to

Peijun Shan

Peijun Mao

Yuzhao Ma

Jingxiang Ma

Tsie Ma

Other publications of authors with the same name

Disambiguation

BibSonomy

Disambiguation of "Ma, Peijun"

copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML Relation between Reliability and Yield of IC's Based on Discrete Defect Distribution Model.

Please choose a person to relate this publication to

Peijun Shan

Peijun Mao

Yuzhao Ma

Jingxiang Ma

Tsie Ma

Other publications of authors with the same name

Disambiguation

copy delete add this publication to your clipboard
community post
history of this post
URL
DOI
BibTeX
EndNote
APA
Chicago
DIN 1505
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MSOffice XML

Relation between Reliability and Yield of IC's Based on Discrete Defect Distribution Model.