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A methodology for defect detection in analog circuits based on causal feature selection., , , и . ICECS 2022, стр. 1-4. IEEE, (2022)A sub-picosecond resolution jitter instrument for GHz frequencies based on a sub-sampling TDA., , , , и . NEWCAS, стр. 1-5. IEEE, (2023)Special Session: On-chip jitter BIST with sub-picosecond resolution at GHz frequencies., , и . LATS, стр. 1-2. IEEE, (2023)Special Session: A high-frequency sinusoidal signal generation using harmonic cancellation., , , и . LATS, стр. 1-2. IEEE, (2023)Linearity test of high-speed high-performance ADCs using a self-testable on-chip generator., , , , , , и . ETS, стр. 1-6. IEEE, (2016)Questioning the reliability of Monte Carlo simulation for machine learning test validation., и . ETS, стр. 1-6. IEEE, (2016)Special session: Hot topics: Statistical test methods., , , , , и . VTS, стр. 1-2. IEEE Computer Society, (2015)A Survey on Sub-6 GHz Wideband LNAs for Ultra- Low-Power IoT applications., , , , и . (октября 2022)On the use of causal feature selection in the context of machine-learning indirect test., , , , , и . DATE, стр. 276-279. IEEE, (2019)Efficient generation of data sets for one-shot statistical calibration of RF/mm-wave circuits., , , , , и . SMACD, стр. 17-20. IEEE, (2019)