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An oscillation-based test technique for on-chip testing of mm-wave phase shifters.

M. Margalef-Rovira, M. Barragán, E. Sharma, P. Ferrari, E. Pistono, and S. Bourdel. VTS, page 1-6. IEEE Computer Society, (2018)

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Hugo Bernal Barragán

Manuel J A Eugster

Manuel

Other publications of authors with the same name

Static linearity BIST for Vcm-based switching SAR ADCs using a reduced-code measurement technique.R. Feitoza, M. Barragán, A. Ginés, and S. Mir. NEWCAS, page 295-298. IEEE, (2020)mm-Wave Through-Load Switch for in-situ Vector Network Analyzer on a 55-nm BiCMOS Technology.M. Margalef-Rovira, A. Saadi, S. Bourdel, M. Barragán, E. Pistono, C. Gaquière, and P. Ferrari. NEWCAS, page 82-85. IEEE, (2020)Efficient generation of data sets for one-shot statistical calibration of RF/mm-wave circuits.F. Cilici, G. Léger, M. Barragán, S. Mir, E. Lauga-Larroze, and S. Bourdel. SMACD, page 17-20. IEEE, (2019)Reduced-code static linearity test of SAR ADCs using a built-in incremental ∑Δ converter.R. Feitoza, M. Barragán, S. Mir, and D. Dzahini. IOLTS, page 29-34. IEEE, (2018)Yield Recovery of mm-Wave Power Amplifiers using Variable Decoupling Cells and One-Shot Statistical Calibration.F. Cilici, M. Barragán, S. Mir, E. Lauga-Larroze, S. Bourdel, and G. Léger. ISCAS, page 1-5. IEEE, (2019)A methodology for defect detection in analog circuits based on causal feature selection.G. Léger, A. Ginés, V. Gutierrez, and M. Barragán. ICECS 2022, page 1-4. IEEE, (2022)A sub-picosecond resolution jitter instrument for GHz frequencies based on a sub-sampling TDA.A. Mamgain, M. Madhvaraj, S. Mir, M. Barragán, and J. Tripathi. NEWCAS, page 1-5. IEEE, (2023)Special Session: On-chip jitter BIST with sub-picosecond resolution at GHz frequencies.M. Madhvaraj, S. Mir, and M. Barragán. LATS, page 1-2. IEEE, (2023)Special Session: A high-frequency sinusoidal signal generation using harmonic cancellation.A. Mamgain, S. Mir, J. Tripathi, and M. Barragán. LATS, page 1-2. IEEE, (2023)Special session: Hot topics: Statistical test methods.M. Barragán, G. Léger, F. Azaïs, R. Blanton, A. Singh, and S. Sunter. VTS, page 1-2. IEEE Computer Society, (2015)

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Disambiguation of "Barragán, Manuel J."

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An oscillation-based test technique for on-chip testing of mm-wave phase shifters.

Please choose a person to relate this publication to

Hugo Bernal Barragán

Manuel J A Eugster

Manuel J A Eugster

Manuel J A Eugster

Manuel

Other publications of authors with the same name

Disambiguation

BibSonomy

Disambiguation of "Barragán, Manuel J."

copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML An oscillation-based test technique for on-chip testing of mm-wave phase shifters.

Please choose a person to relate this publication to

Hugo Bernal Barragán

Manuel J A Eugster

Manuel J A Eugster

Manuel J A Eugster

Manuel

Other publications of authors with the same name

Disambiguation

copy delete add this publication to your clipboard
community post
history of this post
URL
DOI
BibTeX
EndNote
APA
Chicago
DIN 1505
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MSOffice XML

An oscillation-based test technique for on-chip testing of mm-wave phase shifters.