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Aging Compensation in a Class-A High-Frequency Amplifier with DC Temperature Measurements.

J. Altet, X. Aragonès, E. Barajas, X. Gisbert, S. Martínez, и D. Mateo. Sensors, 23 (16): 7069 (августа 2023)

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Review of temperature sensors as monitors for RF-MMW built-in testing and self-calibration schemes.J. Altet, E. Aldrete-Vidrio, F. Reverter, D. Gómez, J. González, M. Onabajo, J. Silva-Martínez, B. Martineau, X. Perpiñà, L. Abdallah и 7 other автор(ы). MWSCAS, стр. 1081-1084. IEEE, (2014)On line monitoring of RF power amplifiers with embedded temperature sensors.J. Altet, D. Mateo, и D. Gómez. IOLTS, стр. 109-113. IEEE Computer Society, (2012)Design of ULV ULP LNAs Exploiting FBB in FDSOI 28nm Technology.X. Aragonès, A. Alvarez, J. Rovayo, J. Altet, и D. Mateo. DCIS, стр. 1-6. IEEE, (2019)Aging Compensation in a Class-A High-Frequency Amplifier with DC Temperature Measurements.J. Altet, X. Aragonès, E. Barajas, X. Gisbert, S. Martínez, и D. Mateo. Sensors, 23 (16): 7069 (августа 2023)Non-invasive RF built-in testing using on-chip temperature sensors.E. Aldrete-Vidrio, M. Onabajo, J. Altet, D. Mateo, и J. Silva-Martínez. ITC, стр. 1. IEEE Computer Society, (2009)DC temperature measurements for power gain monitoring in RF power amplifiers.J. Altet, D. Mateo, D. Gómez, X. Perpiñà, M. Vellvehí, и X. Jordà. ITC, стр. 1-8. IEEE Computer Society, (2012)Differential Sensing Strategy for Dynamic Thermal Testing of ICs.J. Altet, и A. Rubio. VTS, стр. 434-439. IEEE Computer Society, (1997)Sensing temperature in CMOS circuits for Thermal Testing.J. Altet, A. Rubio, M. Salhi, J. Gálvez, S. Dilhaire, A. Syal, и A. Ivanov. VTS, стр. 179-184. IEEE Computer Society, (2004)On the Use of Built-In Temperature Sensors to Monitor Aging in RF Circuits.A. Rungta, J. Altet, E. Barajas, A. Rubio, X. Aragonès, и D. Mateo. DCIS, стр. 1-6. IEEE, (2019)Analysis of the Feasibility of Dynamic Thermal Testing in Digital Circuits.J. Altet, A. Rubio, и H. Tamamoto. Asian Test Symposium, стр. 149-154. IEEE Computer Society, (1997)

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