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IoT: Source of test challenges.

E. Marinissen, Y. Zorian, M. Konijnenburg, C. Huang, P. Hsieh, P. Cockburn, J. Delvaux, V. Rozic, B. Yang, D. Singelée, I. Verbauwhede, C. Mayor, R. Rijsinge, and C. Reyes. ETS, page 1-10. IEEE, (2016)

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Wen-chih Huang

Chih-Hong Huang

Chih-Yao Huang

Matei Chihaia

Jieh-Wen Tsung

Other publications of authors with the same name

A Built-in Self-Test and Self-Diagnosis Scheme for Heterogeneous SRAM Clusters.C. Wang, R. Tzeng, C. Wu, C. Huang, C. Wu, S. Huang, S. Lin, and H. Wang. Asian Test Symposium, page 103-. IEEE Computer Society, (2001)Automatic Generation of Memory Built-in Self-Test Cores for System-on-Chip.K. Cheng, C. Hsueh, J. Huang, J. Yeh, C. Huang, and C. Wu. Asian Test Symposium, page 91-96. IEEE Computer Society, (2001)Optimization of regular expression pattern matching circuits on FPGA.C. Lin, C. Huang, C. Jiang, and S. Chang. DATE Designers' Forum, page 12-17. European Design and Automation Association, Leuven, Belgium, (2006)High-speed C-testable systolic array design for Galois-field inversion.C. Huang, and C. Wu. ED&TC, page 342-346. IEEE Computer Society, (1997)Hardware/software co-designed accelerator for vector graphics applications.S. Chen, H. Lin, H. Wei, Y. Chen, C. Huang, and Y. Chung. SASP, page 108-114. IEEE Computer Society, (2011)A prototype of a wireless-based test system.J. Liou, C. Huang, C. Wu, C. Tien, C. Wang, H. Ma, Y. Chen, Y. Hsu, L. Denq, C. Chiu and 2 other author(s). SoCC, page 225-228. IEEE, (2007)RAMSES: A Fast Memory Fault Simulator.C. Wu, C. Huang, and C. Wu. DFT, page 165-173. IEEE Computer Society, (1999)Fast DNN-based Mechatronics Prototyping Platform on Robotic Arm Control.Y. Chung, H. Lian, Y. Xiao, C. Huang, and J. Liou. AICAS, page 506. IEEE, (2022)Application-level embedded communication tracer for many-core systems.C. Huang, K. Tasi, J. Lin, and H. Chien. ASP-DAC, page 803-808. IEEE, (2015)Optimization of Pattern Matching Circuits for Regular Expression on FPGA.C. Lin, C. Huang, C. Jiang, and S. Chang. IEEE Trans. Very Large Scale Integr. Syst., 15 (12): 1303-1310 (2007)

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Disambiguation of "Huang, Chih-Tsun"

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IoT: Source of test challenges.

Please choose a person to relate this publication to

Wen-chih Huang

Chih-Hong Huang

Chih-Yao Huang

Matei Chihaia

Jieh-Wen Tsung

Other publications of authors with the same name

Disambiguation

BibSonomy

Disambiguation of "Huang, Chih-Tsun"

copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML IoT: Source of test challenges.

Please choose a person to relate this publication to

Wen-chih Huang

Chih-Hong Huang

Chih-Yao Huang

Matei Chihaia

Jieh-Wen Tsung

Other publications of authors with the same name

Disambiguation

copy delete add this publication to your clipboard
community post
history of this post
URL
DOI
BibTeX
EndNote
APA
Chicago
DIN 1505
Harvard
MSOffice XML

IoT: Source of test challenges.