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Diagnosing Cell Internal Defects Using Analog Simulation-Based Fault Models.

, , , , , , , , и . ATS, стр. 318-323. IEEE Computer Society, (2014)

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Tang Tang

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On Methods to Improve Location Based Logic Diagnosis., , , и . VLSI Design, стр. 181-187. IEEE Computer Society, (2006)A case study for using dynamic partitioning based solution in volume diagnosis., , , , , и . DATE, стр. 1001-1002. IEEE, (2018)Employing the STDF V4-2007 Standard for Scan Test Data Logging., , , , , и . IEEE Des. Test, 29 (6): 91-99 (2012)Scan Chain Diagnosis Based on Unsupervised Machine Learning., , , , , и . ATS, стр. 225-230. IEEE Computer Society, (2017)Hyperactive Faults Dictionary to Increase Diagnosis Throughput., , , , , и . ATS, стр. 173-178. IEEE Computer Society, (2008)Diagnosis of Multiple Faults Based on Fault-Tuple Equivalence Tree., , , , и . DFT, стр. 217-225. IEEE Computer Society, (2011)On Testing of Interconnect Open Defects in Combinational Logic Circuits with Stems of Large Fanout., , , , и . ITC, стр. 83-89. IEEE Computer Society, (2002)Deterministic IDDQ diagnosis using a net activation based model., , , , , и . ITC, стр. 1-10. IEEE Computer Society, (2011)Improving Performance of Effect-Cause Diagnosis with Minimal Memory Overhead., , , , и . ATS, стр. 281-287. IEEE, (2007)Distributed dynamic partitioning based diagnosis of scan chain., , , , , , и . VTS, стр. 1-6. IEEE Computer Society, (2013)