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Simple signature verification sub-system for identity recognition., , , , and . CIVEMSA, page 94-98. IEEE, (2017)Family of low-cost NI ELVIS/LabVIEW-based semiconductor testers for engineering education., , , and . CIVEMSA, page 165-170. IEEE, (2017)On machine learning methods to estimate cannabidiolic acid content of Cannabis sativa L. from near-infrared hyperspectral imaging., , , , , , , and . I2MTC, page 1-6. IEEE, (2023)Hough Transform Run Length Encoding for Real-Time Image Processing., , and . IEEE Trans. Instrum. Meas., 56 (3): 962-967 (2007)Guest Editorial Special Section on Sensors Applications Symposium., and . IEEE Trans. Instrum. Meas., (2021)Reducing Burn-in Time through High-Voltage Stress Test and Weibull Statistical Analysis., , , and . IEEE Des. Test Comput., 23 (2): 88-98 (2006)On-Line Testing In Digital Neural Networks., and . Asian Test Symposium, page 295-. IEEE Computer Society, (1996)March PS(23N) Test for DRAM Pattern-Sensitive Faults., , and . Asian Test Symposium, page 354-. IEEE Computer Society, (1998)Smart Wall: Passive Visible Light Positioning with Ambient Light Only., , , and . I2MTC, page 1-6. IEEE, (2019)Predictive Die-Level Reliability-Yield Modeling for Deep Sub-micron Devices., , , and . DELTA, page 216-221. IEEE Computer Society, (2008)