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Advanced double-sampling architectures., and . IOLTS, page 130-132. IEEE, (2016)Efficient Static Compaction of Test Sequence Sets through the Application of Set Covering Techniques., and . DATE, page 194-201. IEEE Computer Society, (2004)Wavelet analysis of measurements for on-line testing analog & mixed-signal circuits., , and . IOLTS, page 83-87. IEEE Computer Society, (2010)Accelerating the compaction of test sequences in sequential circuits through problem size reduction., and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 22 (10): 1443-1449 (2003)Using Non-uniform Crossover in Genetic Algorithm Methods to Speed up the Generation of Test Patterns for Sequential Circuits., and . SETN, volume 2308 of Lecture Notes in Computer Science, page 485-493. Springer, (2002)Prospects of 3D inductors on through silicon vias processes for 3D ICs., , and . VLSI-SoC, page 90-93. IEEE, (2011)Power supply current testing in the production line of emergency luminaire circuits., , , , and . ICECS, page 778-781. IEEE, (2008)Μέθοδοι ελέγχου ολοκληρωμένων ψηφιακών κυκλωμάτων. Aristotle University Of Thessaloniki, Greece, (2004)National Archive of PhD Theses: oai:10442/14664.Design and development of a versatile testing system for analog and mixed-signal circuits., , , , and . ECCTD, page 846-849. IEEE, (2007)Multiple Parametric Circuit Analysis Tool for Detectability Estimation., , , , and . ICECS, page 1111-1114. IEEE, (2007)