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A novel test flow for one-time-programming applications of NROM technology.

, , , and . ITC, page 1-9. IEEE Computer Society, (2009)

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Generating Routing-Driven Power Distribution Networks with Machine-Learning Technique., , , , , , and . ISPD, page 145-152. ACM, (2016)Identifying Good-Dice-in-Bad-Neighborhoods Using Artificial Neural Networks., , , , , , , , , and . VTS, page 1-7. IEEE, (2021)Fault models and test methods for subthreshold SRAMs., , , , and . ITC, page 427-436. IEEE Computer Society, (2010)Testing methods for a write-assist disturbance-free dual-port SRAM., , , , , , and . VTS, page 1-6. IEEE Computer Society, (2014)Mathematical yield estimation for two-dimensional-redundancy memory arrays., , and . ICCAD, page 235-240. IEEE, (2010)Power-switch routing for coarse-grain MTCMOS technologies., , , and . ICCAD, page 39-46. ACM, (2009)A metal-only-ECO solver for input-slew and output-loading violations., , , and . ISPD, page 191-198. ACM, (2009)Fault models for embedded-DRAM macros., , , , and . DAC, page 714-719. ACM, (2009)Theoretical analysis for low-power test decompression using test-slice duplication., and . VTS, page 147-152. IEEE Computer Society, (2010)Testing methods for quaternary content addressable memory using charge-sharing sensing scheme., , , , , , and . ITC, page 1-10. IEEE, (2015)