Author of the publication

copy delete add this publication to your clipboard
community post
history of this post
URL
DOI
BibTeX
EndNote
APA
Chicago
DIN 1505
Harvard
MSOffice XML

Noise Injection Adaption: End-to-End ReRAM Crossbar Non-ideal Effect Adaption for Neural Network Mapping.

Z. He, J. Lin, R. Ewetz, J. Yuan, and D. Fan. DAC, page 57. ACM, (2019)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

Jiann-Sheng Wu

Jiann-Trzuo Lin

Jiann-Chyuan Lin

Fang Yuan

Jing Yuan

Other publications of authors with the same name

Substrate Bias Effect on Dynamic Characteristics of a Monolithically Integrated GaN Half-Bridge.W. Yang, J. Yuan, B. Krishnan, A. Tzou, and W. Yeh. IRPS, page 1-5. IEEE, (2020)Optimization of NULL convention self-timed circuits.S. Smith, R. DeMara, J. Yuan, D. Ferguson, and D. Lamb. Integr., 37 (3): 135-165 (2004)Emerging Technology-Based Design of Primitives for Hardware Security.Y. Bi, K. Shamsi, J. Yuan, P. Gaillardon, G. Micheli, X. Yin, X. Hu, M. Niemier, and Y. Jin. ACM J. Emerg. Technol. Comput. Syst., 13 (1): 3:1-3:19 (2016)Improving power-awareness of pipelined array multipliers using two-dimensional pipeline gating and its application on FIR design.J. Di, J. Yuan, and R. DeMara. Integr., 39 (2): 90-112 (2006)NULL convention multiply and accumulate unit with conditional rounding, scaling, and saturation.S. Smith, R. DeMara, J. Yuan, M. Hagedorn, and D. Ferguson. J. Syst. Archit., 47 (12): 977-998 (2002)ESD Robustness of GaN-on-Si Power Devices under Substrate Biases by means of TLP/VFTLP Tests.W. Yang, N. Stoll, and J. Yuan. IRPS, page 1-5. IEEE, (2020)Security analysis of computing systems from circuit-architectural perspective.S. Taheri, and J. Yuan. DSC, page 166-173. IEEE, (2017)Thermal reliability of VCO using InGaP/GaAs HBTs.X. Liu, J. Yuan, and J. Liou. Microelectron. Reliab., 51 (12): 2147-2152 (2011)Leveraging Emerging Technology for Hardware Security - Case Study on Silicon Nanowire FETs and Graphene SymFETs.Y. Bi, P. Gaillardon, X. Hu, M. Niemier, J. Yuan, and Y. Jin. ATS, page 342-347. IEEE Computer Society, (2014)Logic Obfuscation against IC Reverse Engineering Attacks Using PLGs.Q. Alasad, and J. Yuan. ICCD, page 341-344. IEEE Computer Society, (2017)

BibSonomy

Disambiguation of "Yuan, Jiann-Shiun"

copy delete add this publication to your clipboard
community post
history of this post
URL
DOI
BibTeX
EndNote
APA
Chicago
DIN 1505
Harvard
MSOffice XML

Noise Injection Adaption: End-to-End ReRAM Crossbar Non-ideal Effect Adaption for Neural Network Mapping.

Please choose a person to relate this publication to

Jiann-Sheng Wu

Jiann-Trzuo Lin

Jiann-Chyuan Lin

Fang Yuan

Jing Yuan

Other publications of authors with the same name

Disambiguation

BibSonomy

Disambiguation of "Yuan, Jiann-Shiun"

copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML Noise Injection Adaption: End-to-End ReRAM Crossbar Non-ideal Effect Adaption for Neural Network Mapping.

Please choose a person to relate this publication to

Jiann-Sheng Wu

Jiann-Trzuo Lin

Jiann-Chyuan Lin

Fang Yuan

Jing Yuan

Other publications of authors with the same name

Disambiguation

copy delete add this publication to your clipboard
community post
history of this post
URL
DOI
BibTeX
EndNote
APA
Chicago
DIN 1505
Harvard
MSOffice XML

Noise Injection Adaption: End-to-End ReRAM Crossbar Non-ideal Effect Adaption for Neural Network Mapping.