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Large-Margin Extreme Learning Machines With Hybrid Features for Wafer Map Defect Recognition.

Z. Yi, W. Shang, D. Wang, M. Yin, C. Chen, W. Feng, and X. Wu. IEEE Trans. Instrum. Meas., (2024)

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Zhiwei Yi

Yi Yang

Yi Ni

Yi Wang

Weiyong Yi

Other publications of authors with the same name

Multimodal Surface Material Classification Based on Ensemble Learning with Optimized Features.X. Liu, H. Wu, S. Fang, Z. Yi, and X. Wu. HealthCom, page 1-6. IEEE, (2020)Depth Recognition of Hard Inclusions in Tissue Phantoms for Robotic Palpation.Z. Zhou, S. Fang, C. Ye, T. Mi, B. Huang, X. Li, Z. Yi, and X. Wu. RCAR, page 87-92. IEEE, (2022)GelPixel: A Single-Pixel-Based Tactile Sensor.B. Huang, X. Li, P. Sumari, C. Ye, Z. Zhou, M. Yin, Z. Yi, and X. Wu. RCAR, page 475-480. IEEE, (2023)The Human-Machine Interface Design Based on sEMG and Motor Imagery EEG for Lower Limb Exoskeleton Assistance System.W. Li, Y. Ma, K. Shao, Z. Yi, W. Cao, M. Yin, T. Xu, and X. Wu. IEEE Trans. Instrum. Meas., (2024)Tactile Grasp Stability Classification Based on Graph Convolutional Networks.T. Mi, D. Que, S. Fang, Z. Zhou, C. Ye, C. Liu, Z. Yi, and X. Wu. RCAR, page 875-880. IEEE, (2021)Evaluation of Continual Learning Methods for Object Hardness Recognition.Y. Liu, S. Fang, C. Liu, J. Wang, K. Mai, Y. Zhang, Z. Yi, and X. Wu. RCAR, page 823-828. IEEE, (2023)TactCapsNet: Tactile Capsule Network for Object Hardness Recognition.S. Fang, T. Mi, Z. Zhou, C. Ye, C. Liu, H. Wu, Z. Yi, and X. Wu. RCAR, page 1128-1133. IEEE, (2021)Anti-Drift in Electronic Nose via Dimensionality Reduction: A Discriminative Subspace Projection Approach.Z. Yi, and C. Li. IEEE Access, (2019)Prediction of Contralateral Lower-Limb Joint Angles Using Vibroarthrography and Surface Electromyography Signals in Time-Series Network.C. Wang, B. He, W. Wei, Z. Yi, P. Li, S. Duan, and X. Wu. IEEE Trans Autom. Sci. Eng., 20 (2): 901-908 (April 2023)Large-Margin Extreme Learning Machines With Hybrid Features for Wafer Map Defect Recognition.Z. Yi, W. Shang, D. Wang, M. Yin, C. Chen, W. Feng, and X. Wu. IEEE Trans. Instrum. Meas., (2024)

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Disambiguation of "Yi, Zhengkun"

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Large-Margin Extreme Learning Machines With Hybrid Features for Wafer Map Defect Recognition.

Please choose a person to relate this publication to

Zhiwei Yi

Yi Yang

Yi Ni

Yi Wang

Weiyong Yi

Other publications of authors with the same name

Disambiguation

BibSonomy

Disambiguation of "Yi, Zhengkun"

copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML Large-Margin Extreme Learning Machines With Hybrid Features for Wafer Map Defect Recognition.

Please choose a person to relate this publication to

Zhiwei Yi

Yi Yang

Yi Ni

Yi Wang

Weiyong Yi

Other publications of authors with the same name

Disambiguation

copy delete add this publication to your clipboard
community post
history of this post
URL
DOI
BibTeX
EndNote
APA
Chicago
DIN 1505
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Large-Margin Extreme Learning Machines With Hybrid Features for Wafer Map Defect Recognition.