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Virtual de-embedding study for the accurate extraction of Fin FET gate resistance., , , , , , , , and . CICC, page 1-4. IEEE, (2014)CMOS IC diagnostics using the luminescence of OFF-state leakage currents., , , and . ITC, page 134-139. IEEE Computer Society, (2004)Implementation considerations of a subtracting incoherent optical neuron., and . ICNN, page 403-410. IEEE, (1988)Fusion of Biologically Inspired and Visual Perception Based Feature Sets for Object Recognition., and . IPCV, page 667-673. CSREA Press, (2010)Bring the Outside In: Providing Accessible Experiences Through VR for People with Dementia in Locked Psychiatric Hospitals., , , , , , and . CHI, page 236. ACM, (2019)On-Chip Spectrum Analyzer for Analog Built-In Self Test., , and . VTS, page 131-136. IEEE Computer Society, (2005)Effect of HCI degradation on the variability of MOSFETS., , , and . IRPS, page 1. IEEE, (2018)Long-term data for BTI degradation in 32nm IBM microprocessor using HKMG technology., , , and . IRPS, page 6. IEEE, (2015)Integrated RF components in a SiGe bipolar technology., , , , , , , and . IEEE J. Solid State Circuits, 32 (9): 1440-1445 (1997)Performance impact of through-silicon vias (TSVs) in three-dimensional technology measured by SRAM ring oscillators., , , and . ESSCIRC, page 419-422. IEEE, (2013)