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An Effective Built-In Self-Test for Chargepump PLL., , , , и . IEICE Trans. Electron., 88-C (8): 1731-1733 (2005)A Clustered RIN BIST Based on Signal Probabilities of Deterministic Test Sets., и . IEICE Trans. Inf. Syst., 89-D (1): 354-357 (2006)TOSCA: Total Scan Power Reduction Architecture based on Pseudo-Random Built-in Self Test Structure., , , , и . ATS, стр. 17-24. IEEE, (2006)MTR-Fill: A Simulated Annealing-Based X-Filling Technique to Reduce Test Power Dissipation for Scan-Based Designs., , , и . IEICE Trans. Inf. Syst., 91-D (4): 1197-1200 (2008)Increasing Embedding Probabilities of RPRPs in RIN Based BIST., и . Asia-Pacific Computer Systems Architecture Conference, том 3740 из Lecture Notes in Computer Science, стр. 600-613. Springer, (2005)An Efficient On-Line Monitoring BIST for Remote Service System., , , и . AISA, том 2402 из Lecture Notes in Computer Science, стр. 205-214. Springer, (2002)