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Impact of well edge proximity effect on timing., , , , , , and . ESSCIRC, page 115-118. IEEE, (2007)Dynamic Supply Noise Measurement with All Digital Gated Oscillator for Evaluating Decoupling Capacitance Effect., , and . CICC, page 783-786. IEEE, (2007)Measurement of Inductive Coupling Effect on Timing in 90nm Global Interconnects., , and . CICC, page 721-724. IEEE, (2006)Measurement results of delay degradation due to power supply noise well correlated with full-chip simulation., , , , and . CICC, page 861-864. IEEE, (2006)Impacts of flexible Vth control, low process variability, and steep SS with low on-current of new structure transistors to ultra-low voltage designs., , , , and . IEICE Electron. Express, 12 (15): 20150460 (2015)Dynamic supply noise measurement circuit composed of standard cells suitable for in-site SoC power integrity verification., , and . ASP-DAC, page 107-108. IEEE, (2008)Standard cell implementation of buskeeper PUF with symmetric inverters and neighboring cells for passing randomness tests., , and . GCCE, page 550-551. IEEE, (2015)Quantitative Prediction of On-chip Capacitive and Inductive Crosstalk Noise and Discussion on Wire Cross-Sectional Area Toward Inductive Crosstalk Free Interconnects., , and . ICCD, page 70-75. IEEE, (2006)0.39-V, 18.26-µW/MHz SOTB CMOS Microcontroller with embedded atom switch ROM., , , , , , , , , and 8 other author(s). COOL Chips, page 1-3. IEEE Computer Society, (2015)Validation of a Full-Chip Simulation Model for Supply Noise and Delay Dependence on Average Voltage Drop With On-Chip Delay Measurement., , , , and . IEEE Trans. Circuits Syst. II Express Briefs, 54-II (10): 868-872 (2007)