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Variation and failure characterization through pattern classification of test data from multiple test stages.

, , , , , , and . ITC, page 1-10. IEEE, (2016)

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Contest: A Concurrent Test Generator for Sequential Circuits., , and . DAC, page 84-89. ACM, (1988)On the Over-Specification Problem in Sequential ATPG Algorithms., and . DAC, page 16-21. IEEE Computer Society Press, (1992)Guest Editorial., , and . J. Electron. Test., 11 (1): 7-8 (1997)Finite state machine synthesis with embedded test function., and . J. Electron. Test., 1 (3): 221-228 (1990)Test-Quality Optimization for Variable $n$ -Detections of Transition Faults., , , , , and . IEEE Trans. Very Large Scale Integr. Syst., 22 (8): 1738-1749 (2014)A Simulation-Based Method for Generating Tests for Sequential Circuits., , and . IEEE Trans. Computers, 39 (12): 1456-1463 (1990)STOIC: state assignment based on output/input functions., and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 12 (8): 1123-1131 (1993)Perturb and simplify: multilevel Boolean network optimizer., , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 15 (12): 1494-1504 (1996)SVM Binary Classifier Ensembles for Image Classification., , and . CIKM, page 395-402. ACM, (2001)Reliability Analysis for Flexible Electronics: Case Study of Integrated a-Si: H TFT Scan Driver., , , and . DAC, page 966-969. IEEE, (2007)