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Designing and Testing High Dependable Memories for Aerospace Applications., , , , and . VLSI-SOC, page 221-. Technische Universität Darmstadt, Insitute of Microelectronic Systems, (2003)A Self-Repairing Execution Unit for Microprogrammed Processors., , and . IEEE Micro, 21 (5): 16-22 (2001)DTIS 2015 foreword., and . DTIS, page 1. IEEE, (2015)An experimental analysis of the effectiveness of the circular self-test path technique., , and . EURO-DAC, page 246-251. IEEE Computer Society, (1994)The Use of Model Checking in ATPG for Sequential Circuits., , , and . CAV, volume 531 of Lecture Notes in Computer Science, page 86-95. Springer, (1990)On-line Testing of an Off-the-shelf Microprocessor Board for Safety-critical Applications., , , , , , and . EDCC, volume 1150 of Lecture Notes in Computer Science, page 190-202. Springer, (1996)Scan chain encryption for the test, diagnosis and debug of secure circuits., , , , , and . ETS, page 1-6. IEEE, (2017)SATTA: A Self-Adaptive Temperature-Based TDF Awareness Methodology for Dynamically Reconfigurable FPGAs., , , , and . ACM Trans. Reconfigurable Technol. Syst., 8 (1): 1:1-1:22 (2015)Performance and Reliability Analysis of Cross-Layer Optimizations of NAND Flash Controllers., , , , , , and . ACM Trans. Embed. Comput. Syst., 14 (1): 7:1-7:24 (2015)A new approach to build a low-level malicious fault list starting from high-level description and alternative graphs., , , , and . ED&TC, page 560-565. IEEE Computer Society, (1997)