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Disambiguation of "Tanaka, Koji"

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On-Line Multi-Frequency Electrical Resistance Tomography (mfERT) Device for Crystalline Phase Imaging in High-Temperature Molten Oxide.

, , , , , , , and . Sensors, 22 (3): 1025 (2022)

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Koji Kameo

Masao Tanaka

Koji Onoda

Masafumi Tanaka

Koji Ota

 

Other publications of authors with the same name

A 0.41 µA Standby Leakage 32 kb Embedded SRAM with Low-Voltage Resume-Standby Utilizing All Digital Current Comparator in 28 nm HKMG CMOS., , , , , , and . IEEE J. Solid State Circuits, 48 (4): 917-923 (2013)Vision chip architecture with light adaptation mechanism., , , and . Artif. Life Robotics, 2 (1): 12-18 (1998)Study on Hiring Decision: Analyzing Rejected Applicants by Mining Individual Job Placement Data of Public Employment Security Offices., , , and . KES, volume 60 of Procedia Computer Science, page 1156-1163. Elsevier, (2015)A 512-kb 1-GHz 28-nm partially write-assisted dual-port SRAM with self-adjustable negative bias bitline., , , , , , , and . VLSIC, page 1-2. IEEE, (2014)Dialogue-Act Prediction of Future Responses Based on Conversation History., , and . ACL (2), page 197-202. Association for Computational Linguistics, (2019)A Pocket-Size Alphabet Display with Letter Trajectories Presented to Fingers., , , and . EuroHaptics (1), volume 9774 of Lecture Notes in Computer Science, page 472-482. Springer, (2016)28 nm 50% Power-Reducing Contacted Mask Read Only Memory Macro With 0.72-ns Read Access Time Using 2T Pair Bitcell and Dynamic Column Source Bias Control Technique., , , , , , , , , and 1 other author(s). IEEE Trans. Very Large Scale Integr. Syst., 22 (3): 575-584 (2014)Feature Comparison of Hotel Reviews by Hotel Type using Dependency Graph., , , and . KES, volume 159 of Procedia Computer Science, page 1357-1364. Elsevier, (2019)An Extraction Method of ITSS Common Skill Knowledge Using Japanese Text Network Analysis., and . KES, volume 35 of Procedia Computer Science, page 918-928. Elsevier, (2014)On-Line Multi-Frequency Electrical Resistance Tomography (mfERT) Device for Crystalline Phase Imaging in High-Temperature Molten Oxide., , , , , , , and . Sensors, 22 (3): 1025 (2022)