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DFSSD: Deep Faults and Shallow State Duality, A Provably Strong Obfuscation Solution for Circuits with Restricted Access to Scan Chain., , , , , , и . VTS, стр. 1-6. IEEE, (2020)Reducing Aging Impacts in Digital Sensors via Run-Time Calibration., , , , и . J. Electron. Test., 37 (5): 653-673 (2021)The 28th IEEE European Test Symposium.. IEEE Des. Test, 41 (1): 91-92 (февраля 2024)Leakage Power Analysis in Different S-Box Masking Protection Schemes., , , , и . DATE, стр. 1263-1268. IEEE, (2022)On the Impact of Aging on Power Analysis Attacks Targeting Power-Equalized Cryptographic Circuits., , , и . ASP-DAC, стр. 414-420. ACM, (2021)Robust and Efficient Data Security Solution for Pervasive Data Sharing in IoT., , , и . CCNC, стр. 775-781. IEEE, (2022)Security Order of Gate-Level Masking Schemes., , , , и . HOST, стр. 57-67. IEEE, (2023)Aging-Induced Failure Prognosis via Digital Sensors., , , , и . ACM Great Lakes Symposium on VLSI, стр. 703-708. ACM, (2023)Exploiting small leakages in masks to turn a second-order attack into a first-order attack., , , , и . HASP@ISCA, стр. 7:1-7:5. ACM, (2015)Testing of Clock-Domain Crossing Faults in Multi-core System-on-Chip., , , , и . Asian Test Symposium, стр. 7-14. IEEE Computer Society, (2011)