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Embedded Scan Test with Diagnostic Features for Self-Testing SoCs.

, , , , , and . IOLTS, page 181-182. IEEE Computer Society, (2006)

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RESCUE: Cross-Sectoral PhD Training Concept for Interdependent Reliability, Security and Quality., , and . EWME, page 45-50. IEEE, (2018)Test eingebetteter Prozessoren im Zielsystem mit hoher diagnostischer Auflösung., and . GI-Jahrestagung, volume P-246 of LNI, page 1399-1413. GI, (2015)Detection and Correction of Logic Errors Using Extra Time Slots., and . GI-Jahrestagung, volume P-246 of LNI, page 1431-1443. GI, (2015)RESCUE: Interdependent Challenges of Reliability, Security and Quality in Nanoelectronic Systems., , , , , , , , , and 8 other author(s). CoRR, (2019)Gate delay fault test generation for non-scan circuits., , , and . ED&TC, page 308-313. IEEE Computer Society, (1995)Local microcode generation in system design., , , and . Code Generation for Embedded Processors, page 171-187. Kluwer, (1994)Generating reliable embedded processors., and . IEEE Micro, 18 (5): 33-41 (1998)A register-transfer-level fault simulator for permanent and transient faults in embedded processors., , , , and . DATE, page 811. IEEE Computer Society, (2001)Built-in Self Repair by Reconfiguration of FPGAs., , and . IOLTS, page 187-188. IEEE Computer Society, (2006)Fast power overhead prediction for hardware redundancy-based fault tolerance., and . IOLTS, page 265-270. IEEE, (2017)