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Transformation of multiple fault models to a unified model for ATPG efficiency enhancement., and . ITC, page 1-10. IEEE, (2016)Deep Learning Agents for Efficient Dynamic Production Control in Semiconductor Manufacturing., , and . CASE, page 1-6. IEEE, (2023)Test generation for open and delay faults in CMOS circuits., , and . ITC-Asia, page 21-26. IEEE, (2017)Parallel machine scheduling with time constraints on machine qualifications., , , and . Comput. Oper. Res., (2019)Repairable Cell-Based Chip Design for Simultaneous Yield Enhancement and Fault Diagnosis., , and . ATS, page 25-30. IEEE Computer Society, (2016)A Repair-for-Diagnosis Methodology for Logic Circuits., , , and . IEEE Trans. Very Large Scale Integr. Syst., 26 (11): 2254-2267 (2018)An innovative approach for strategic capacity portfolio planning under uncertainties., and . Eur. J. Oper. Res., 207 (2): 1002-1013 (2010)Dynamic dispatching for re-entrant production lines - A deep learning approach., , and . CASE, page 1026-1031. IEEE, (2017)Developing Acceptance Policies for a Stochastic Single-Resource Revenue Management Problem., , , and . COMPSAC Workshops, page 84-88. IEEE Computer Society, (2015)An efficient diagnosis-aware pattern generation procedure for transition faults., and . ITC, page 1-10. IEEE Computer Society, (2014)