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Where has all my memory gone?: determining memory characteristics of product variants using virtual-machine-level monitoring.

, , , , и . VaMoS, стр. 13:1-13:8. ACM, (2014)

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Florian Angerer

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Opportunities and challenges of static code analysis of IEC 61131-3 programs., , , , и . ETFA, стр. 1-8. IEEE, (2012)Custom-developed vs. model-based configuration tools: experiences from an industrial automation ecosystem., , , , , и . SPLC Workshops, стр. 52-58. ACM, (2013)Modular Change Impact Analysis for Configurable Software., , и . ICSME, стр. 468-472. IEEE Computer Society, (2016)Points-to analysis of IEC 61131-3 programs: Implementation and application., , , и . ETFA, стр. 1-8. IEEE, (2013)Feature-oriented development in industrial automation software ecosystems: Development scenarios and tool support., , , , и . INDIN, стр. 1218-1223. IEEE, (2016)Variability-aware change impact analysis of multi-language product lines.. ASE, стр. 903-906. ACM, (2014)A prototype-based approach for managing clones in clone-and-own product lines., , , и . SPLC, стр. 35-44. ACM, (2016)Configuration-Aware Change Impact Analysis (T)., , , и . ASE, стр. 385-395. IEEE Computer Society, (2015)An Experiment Comparing Lifted and Delayed Variability-Aware Program Analysis., , , и . ICSME, стр. 148-158. IEEE Computer Society, (2017)Where has all my memory gone?: determining memory characteristics of product variants using virtual-machine-level monitoring., , , , и . VaMoS, стр. 13:1-13:8. ACM, (2014)