( en | de | ru )

 

Disambiguation of "Sasaki, JM"

Author of the publication

copydeleteadd this publication to your clipboard
Temperature studies of KH2PO4 : Mn crystals using x-ray diffraction and polarized Raman scattering

, , , , , and . PHYSICAL REVIEW B, (2005)
DOI: 10.1103/PhysRevB.72.014121

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

Mei Sasaki

Manami Sasaki

Chiyoko Sasaki

Felix Sasaki

Rudolf Jmhof

 

Other publications of authors with the same name

Temperature-dependent Raman study of taurine single crystal, , , , , and . JOURNAL OF RAMAN SPECTROSCOPY, 32 (9): 751-756 (2001)Temperature-dependent Raman scattering studies in NaNbO3 ceramics, , , , , , , , , and . JOURNAL OF RAMAN SPECTROSCOPY, 33 (8): 669-674 (2002)Temperature-dependent Raman scattering studies in CsLiSO4 and RbxCs(1-x)LiSO(4) (x=0.35), , , , , , and . JOURNAL OF RAMAN SPECTROSCOPY, 32 (12): 1046-1051 (2001)Piezoelectric properties of collagen-nanocrystalline hydroxyapatite composites, , , , , , and . JOURNAL OF MATERIALS SCIENCE, 37 (10): 2061-2070 (2002)A new phase in the LiRbSO4-LiCsSO4 system, , , , , , and . JOURNAL OF PHYSICS-CONDENSED MATTER, 12 (34): 7559-7568 (2000)X-ray multiple diffraction in Renninger scanning mode: Simulation of data recorded using synchrotron radiation, , , , , , and . JOURNAL OF APPLIED CRYSTALLOGRAPHY, 29 (4): 325-330 (1996)THE SENSITIVITY OF RENNINGER SCAN INTENSITIES WITH A1 CONTENT IN GA1-XALXAS/GAAS SAMPLES, , and . DEFECT ENGINEERING IN SEMICONDUCTOR GROWTH, PROCESSING AND DEVICE TECHNOLOGY, volume 262 of MATERIALS RESEARCH SOCIETY SYMPOSIUM PROCEEDINGS, page 259-263. PITTSBURGH, FUJI XEROX; HITACHI; MAT RES SOC; CO APPLICAT MECAN ELECTR CINEMA ATOMIST; EASTMAN KODAK; ELECT POWER RES INST; FUJITSU; HUGHES RES LABS; JAPAN BROADCASTING; JAPAN ELECTR OPT LAB, MATERIALS RESEARCH SOC, (1992)SYMP ON DEFECT ENGINEERING IN SEMICONDUCTOR GROWTH, PROCESSING AND DEVICE TECHNOLOGY, AT THE 1992 SPRING MEETING OF THE MATERIALS RESEARCH SOC, SAN FRANCISCO, CA, APR 26-MAY 01, 1992.Low-temperature Raman spectra of monohydrated L-asparagine crystals, , , , , , , , and . JOURNAL OF RAMAN SPECTROSCOPY, 35 (3): 236-241 (2004)Yttria thin films doped with rare earth for applications in radiation detectors and thermoluminescent dosimeters, , , , and . MICROELECTRONICS JOURNAL, 34 (5-8): 557-559 (2003)Conference on Low Dimensional Structures and Devices (LDSD), FORTALEZA, BRAZIL, DEC 08-13, 2002.The use of X-ray diffraction, microscopy, and magnetic measurements for analysing microstructural features of a duplex stainless steel, , , , and . MATERIALS CHARACTERIZATION, 54 (4-5): 387-393 (2005)