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Detecting Multiple Faults in One-Dimensional Arrays of Reversible QCA Gates.

, , , and . J. Electron. Test., 25 (1): 39-54 (2009)

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FsmTest: Functional test generation for sequential circuits., , , and . Integr., 20 (3): 303-325 (1996)Design of sequential circuits by quantum-dot cellular automata., , and . Microelectron. J., 38 (4-5): 525-537 (2007)An Architecture and an Interconnection Scheme for Time-Sliced Buses in Real-Time Processing., , and . RTSS, page 20-27. IEEE Computer Society, (1986)Measuring the timing jitter of ATE in the frequency domain., , , , , , , , , and . IEEE Trans. Instrumentation and Measurement, 55 (1): 280-289 (2006)Analysis and measurement of fault coverage in a combined ATE and BIST environment., , and . IEEE Trans. Instrumentation and Measurement, 53 (2): 300-307 (2004)A Novel Statistical Timing and Leakage Power Characterization of Partially Depleted Silicon-on-Insulator Gates., , and . IEEE Trans. Instrumentation and Measurement, 58 (2): 401-410 (2009)Embedded Fault-Tolerant Systems., , , and . IEEE Micro, 18 (5): 8-11 (1998)Maximal diagnosis of interconnects of random access memories., , , and . IEEE Trans. Reliability, 52 (4): 423-434 (2003)Sequential diagnosis of processor array systems., , , and . IEEE Trans. Reliability, 53 (4): 487-498 (2004)On the Constant Diagnosability of Baseline Interconnection Networks., and . IEEE Trans. Computers, 39 (12): 1485-1488 (1990)