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On the Error Effects of Random Clock Shifts in Quantum-Dot Cellular Automata Circuits.

, , , , , and . DFT, page 487-495. IEEE Computer Society, (2007)

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Defect Oriented Testing for analog/mixed-signal devices., , , , , , and . ITC, page 1-10. IEEE Computer Society, (2011)Test time reduction in analogue/mixed-signal devices by defect oriented testing: An industrial example., , , , , , and . DATE, page 371-376. IEEE, (2011)Error-Resilient Test Data Compression Using Tunstall Codes., , and . DFT, page 316-323. IEEE Computer Society, (2004)Modeling and Evaluating Errors Due to Random Clock Shifts in Quantum-Dot Cellular Automata Circuits., , , , , , and . J. Electron. Test., 25 (1): 55-66 (2009)Hybrid Multisite Testing at Manufacturing., , , and . ITC, page 927-936. IEEE Computer Society, (2003)Two dimensional reordering of functional test data for compression by ATE., and . ACM Great Lakes Symposium on VLSI, page 188-192. ACM, (2005)Test Time Reduction in a Manufacturing Environment by Combining BIST and ATE., , and . DFT, page 186-194. IEEE Computer Society, (2002)A Novel Methodology for Functional Test Data Compression., and . DFT, page 128-135. IEEE Computer Society, (2006)Improving Error Resilience for Compressed Test Sets by Don't Care Assignment., and . SoCC, page 65-68. IEEE, (2005)Fast and Robust LRSD-Based SAR/ISAR Imaging and Decomposition., , , , and . IEEE Trans. Geosci. Remote. Sens., (2022)