( en | de | ru )

 

Disambiguation of "Stanisavljevic, Milos"

Author of the publication

copydeleteadd this publication to your clipboard
Non-resistance metric based read scheme for multi-level PCRAM in 25 nm technology.

, , , , , , , , , , , and . CICC, page 1-4. IEEE, (2015)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

Milos Horvath

Milos Jovanovic

Milos Puzovic

Alesia Miloslavina

Yuliya Miloslavina

 

Other publications of authors with the same name

Phase-change memory: Feasibility of reliable multilevel-cell storage and retention at elevated temperatures., , , , and . IRPS, page 5. IEEE, (2015)Acceleration of Decision-Tree Ensemble Models on the IBM Telum Processor., , , , , , , , , and 1 other author(s). ISCAS, page 1-5. IEEE, (2023)Fault-Tolerance of Robust Feed-Forward Architecture Using Single-Ended and Differential Deep-Submicron Circuits Under Massive Defect Density., , and . IJCNN, page 2771-2778. IEEE, (2006)Circuit and System-Level Aspects of Phase Change Memory., , and . IEEE Trans. Circuits Syst. II Express Briefs, 68 (3): 844-850 (2021)Accelerated ML-Assisted Tumor Detection in High-Resolution Histopathology Images., , , , , , , , and . MICCAI (1), volume 11764 of Lecture Notes in Computer Science, page 406-414. Springer, (2019)High-Throughput ECC with Integrated Chipkill Protection for Nonvolatile Memory Arrays., , , and . ISCAS, page 1-5. IEEE, (2021)A Fast and Scalable Pipeline for Stain Normalization of Whole-Slide Images in Histopathology., , , , , , , , and . ECCV Workshops (6), volume 11134 of Lecture Notes in Computer Science, page 424-436. Springer, (2018)Design and realization of a fault-tolerant 90nm CMOS cryptographic engine capable of performing under massive defect density., , , , and . ACM Great Lakes Symposium on VLSI, page 204-207. ACM, (2007)Output probability density functions of logic circuits: Modeling and fault-tolerance evaluation., , and . VLSI-SoC, page 328-334. IEEE, (2010)Deep learning acceleration based on in-memory computing., , , , , , , , , and 7 other author(s). IBM J. Res. Dev., 63 (6): 7:1-7:16 (2019)