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Defect Detection Differences between Launch-Off-Shift and Launch-Off-Capture in Sense-Amplifier-Based Flip-Flop Testing.

. VTS, стр. 33-38. IEEE Computer Society, (2009)

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Validation and Test of Network Processors and ASICs., , , , и . VTS, стр. 407-410. IEEE Computer Society, (2002)Fault simulation of interconnect opens in digital CMOS circuits.. ICCAD, стр. 548-554. IEEE Computer Society / ACM, (1997)A Linear Program Driven Scheduling and Allocation Method Followed by an Interconnect Optimization Algorithm., и . DAC, стр. 77-83. IEEE Computer Society Press, (1990)DFFT : Design For Functional Testability., и . ITC, стр. 1105-1114. IEEE Computer Society, (2003)DFT and Test Problems from the Trenches.. VTS, стр. 120. IEEE Computer Society, (2009)On invalidation mechanisms for non-robust delay tests.. ITC, стр. 393-399. IEEE Computer Society, (2000)Voltage- and current-based fault simulation for interconnect open defects.. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 18 (12): 1768-1779 (1999)Defect Detection Differences between Launch-Off-Shift and Launch-Off-Capture in Sense-Amplifier-Based Flip-Flop Testing.. VTS, стр. 33-38. IEEE Computer Society, (2009)Oscillation and Sequential Behavior Caused by Interconnect Opens in Digital CMOS Circuits., и . ITC, стр. 597-606. IEEE Computer Society, (1997)Explorations of sequential ATPG using Boolean satisfiability., и . VTS, стр. 85-90. IEEE Computer Society, (1993)