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Intercomparison and analyses of the climatology of the West African Monsoon in the West African Monsoon Modeling and Evaluation project (WAMME) first model intercomparison experiment

Y. Xue, F. De Sales, W. Lau, A. Boone, J. Feng, P. Dirmeyer, Z. Guo, K. Kim, A. Kitoh, V. Kumar, I. Poccard-Leclercq, N. Mahowald, W. Moufouma-Okia, P. Pegion, D. Rowell, J. Schemm, S. Schubert, A. Sealy, W. Thiaw, A. Vintzileos, S. Williams, M. Wu, Y. Xue, F. Sales, Lau, A. Boone, J. Feng, P. Dirmeyer, Z. Guo, K. Kim, A. Kitoh, V. Kumar, I. Poccard-Leclercq, N. Mahowald, W. Moufouma-Okia, P. Pegion, D. Rowell, J. Schemm, S. Schubert, A. Sealy, W. Thiaw, A. Vintzileos, S. Williams, and M. Wu. Climate Dynamics, 35 (1): 3--27 (Jul 1, 2010)
DOI: 10.1007/s00382-010-0778-2

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Xue Xue Zhang

Yongkang Liu

YongKang Le

Cheng Xue

Jia Xue

Other publications of authors with the same name

Intercomparison and analyses of the climatology of the West African Monsoon in the West African Monsoon Modeling and Evaluation project (WAMME) first model intercomparison experimentY. Xue, F. De Sales, W. Lau, A. Boone, J. Feng, P. Dirmeyer, Z. Guo, K. Kim, A. Kitoh, V. Kumar and 34 other author(s). Climate Dynamics, 35 (1): 3--27 (Jul 1, 2010)Investigation of Hot Carrier Enhanced Body Bias Effect in Advanced FinFET Technology.Z. Sun, H. Lu, Y. Xue, W. Luo, Z. Wang, J. Zhang, Z. Ji, R. Wang, and R. Huang. IRPS, page 1-6. IEEE, (2023)The WAMME regional model intercomparison studyL. Druyan, J. Feng, K. Cook, Y. Xue, M. Fulakeza, S. Hagos, A. Konaré, W. Moufouma-Okia, D. Rowell, E. Vizy and 1 other author(s). Climate Dynamics, 35 (1): 175--192 (2010)Convolution-Based Vth Shift Prediction and the New 9T2C Pixel Circuit in LTPS TFT AMOLED.S. Xia, L. Zhou, K. Wang, X. Fan, Y. Xue, Q. Shan, H. Wang, P. Ren, Z. Ji, and R. Huang. IRPS, page 1-7. IEEE, (2024)Investigation of Interplays between Body Biasing and Hot Carrier Degradation (HCD) in Advanced NMOS FinFETs.Z. Sun, Y. Xue, H. Lu, P. Ren, Z. Wang, Z. Ji, R. Wang, and R. Huang. IRPS, page 72. IEEE, (2024)A New Method of Automatic Extraction of RTN and OMI-Friendly Implementation.Y. Xiao, C. Zhang, D. Wang, Y. Xue, P. Ren, and Z. Ji. IRPS, page 75. IEEE, (2024)Investigation of Positive Bias Temperature Instability in advanced FinFET nodes.Y. Xue, M. Yuan, Y. Li, D. Wang, M. Wu, P. Ren, L. Zhang, R. Wang, Z. Ji, and R. Huang. IRPS, page 1-5. IEEE, (2024)Catching the Missing EM Consequence in Soft Breakdown Reliability in Advanced FinFETs: Impacts of Self-heating, On-State TDDB, and Layout Dependence.Z. Dong, Z. Sun, X. Yang, X. Li, Y. Xue, C. Luo, P. Cai, Z. Wang, S. Wang, Y. Zhang and 6 other author(s). VLSI Technology and Circuits, page 1-2. IEEE, (2023)Sub-20-nm DRAM Technology under Negative Bias Temperature Instability (NBTI): from Characterization to Physical Origin Identification.D. Wang, Y. Xue, Y. Liu, P. Ren, Z. Sun, Z. Wang, Y. Liu, Z. Cheng, H. Yang, X. Liu and 5 other author(s). IRPS, page 9. IEEE, (2024)

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Disambiguation of "Xue, Yongkang"