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Small Delay Fault Model for Intra-Gate Resistive Open Defects.

, , , , , , и . VTS, стр. 27-32. IEEE Computer Society, (2009)

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Kazuhiko Yoshida

Kazuhiko Yoshida

Kazuhiko Sano

Kazuhiko Uzawa

Kazuhiko Yoshida

 

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Aliasing Probabilities and Weight Distributions of Several Codes., и . Syst. Comput. Jpn., 20 (9): 81-88 (1989)Analysis of Fault Detection Probability of CMOS Combinational Circuits and Its Application to Signature Testing.. Syst. Comput. Jpn., 21 (5): 29-38 (1990)Note on Layout-Aware Weighted Probabilistic Bridge Fault Coverage., , и . Asian Test Symposium, стр. 89-94. IEEE Computer Society, (2012)Seed Selection Procedure for LFSR-Based BIST with Multiple Scan Chains and Phase Shifters., , , , и . Asian Test Symposium, стр. 190-195. IEEE Computer Society, (2004)Analysis of Probabilistic Trapezoid Protocol for Data Replication., , , , и . DSN, стр. 782-791. IEEE Computer Society, (2005)A seed selection procedure for LFSR-based random pattern generators., , , , и . ASP-DAC, стр. 869-874. ACM, (2003)Technique to Diagnose Open Defects that Takes Coupling Effects into Consideration., , , , , и . IEICE Trans. Inf. Syst., 87-D (9): 2179-2185 (2004)Test Data Compression of 100x for Scan-Based BIST., , , , , , , и . ITC, стр. 1-10. IEEE Computer Society, (2006)A Distributed Data Replication Protocol for File Versioning with Optimal Node Assignments., , , , и . PRDC, стр. 117-124. IEEE Computer Society, (2010)Analysis of Using Convolutional Codes to Recover Packet Losses over Burst Erasure Channels., , , , и . PRDC, стр. 258-265. IEEE Computer Society, (2001)