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Yield Forecasting Across Semiconductor Fabrication Plants and Design Generations.

A. Ahmadi, H. Stratigopoulos, K. Huang, A. Nahar, B. Orr, M. Pas, J. Carulli, and Y. Makris. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 36 (12): 2120-2133 (2017)

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John M Sullivan

John M MacMahon

Simon M M Laimer

M. Biswas M. Dam

Marcel M M Kuypers

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Systematic defect detection methodology for volume diagnosis: A data mining perspective.C. Shan, P. Babighian, Y. Pan, J. Carulli, and L. Wang. ITC, page 1-10. IEEE, (2017)A design-for-reliability approach based on grading library cells for aging effects.S. Arasu, M. Nourani, J. Carulli, K. Butler, and V. Reddy. ITC, page 1-7. IEEE Computer Society, (2013)Test data analytics - Exploring spatial and test-item correlations in production test data.C. Hsu, F. Lin, K. Cheng, W. Zhang, X. Li, J. Carulli, and K. Butler. ITC, page 1-10. IEEE Computer Society, (2013)Pylon: Towards an integrated customizable volume diagnosis infrastructure.Y. Pan, R. Desineni, K. Sekar, A. Chittora, S. Fernandes, N. Bawaskar, and J. Carulli. ITC, page 1-9. IEEE, (2016)Performance entitlement by exploiting transistor's BTI recovery.S. Arasu, M. Nourani, V. Reddy, and J. Carulli. ISQED, page 341-346. IEEE, (2013)Counterfeit electronics: A rising threat in the semiconductor manufacturing industry.K. Huang, J. Carulli, and Y. Makris. ITC, page 1-4. IEEE Computer Society, (2013)Asymmetric aging of clock networks in power efficient designs.S. Arasu, M. Nourani, F. Cano, J. Carulli, and V. Reddy. ISQED, page 484-486. IEEE, (2014)Special session 11B: ITRS adaptive test update.J. Carulli. VTS, page 1. IEEE Computer Society, (2014)Yield Forecasting Across Semiconductor Fabrication Plants and Design Generations.A. Ahmadi, H. Stratigopoulos, K. Huang, A. Nahar, B. Orr, M. Pas, J. Carulli, and Y. Makris. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 36 (12): 2120-2133 (2017)Statistical Methods for Detecting Recycled Electronics: From ICs to PCBs and Beyond.K. Huang, Y. Liu, N. Korolija, J. Carulli, and Y. Makris. IEEE Des. Test, 41 (2): 15-22 (2024)

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Disambiguation of "Carulli, John M."

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Yield Forecasting Across Semiconductor Fabrication Plants and Design Generations.

Please choose a person to relate this publication to

John M Sullivan

John M MacMahon

Simon M M Laimer

M. Biswas M. Dam

Marcel M M Kuypers

Other publications of authors with the same name

Disambiguation

BibSonomy

Disambiguation of "Carulli, John M."

copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML Yield Forecasting Across Semiconductor Fabrication Plants and Design Generations.

Please choose a person to relate this publication to

John M Sullivan

John M MacMahon

Simon M M Laimer

M. Biswas M. Dam

Marcel M M Kuypers

Other publications of authors with the same name

Disambiguation

copy delete add this publication to your clipboard
community post
history of this post
URL
DOI
BibTeX
EndNote
APA
Chicago
DIN 1505
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Yield Forecasting Across Semiconductor Fabrication Plants and Design Generations.