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High-performance ADC linearity test using low-precision signals in non-stationary environments., , , , и . ITC, стр. 10. IEEE Computer Society, (2005)A low cost method for testing offset and gain error for ADC BIST., , и . ISCAS, стр. 2023-2026. IEEE, (2012)A compact low-power supply-insensitive CMOS current reference., , и . ISCAS, стр. 2825-2828. IEEE, (2012)A High Constancy Rail-to-rail Level Shift Generator for SEIR-based BIST circuit for ADCs., , и . ISCAS, стр. 1-5. IEEE, (2018)A cost-effective histogram test-based algorithm for digital calibration of high-precision pipelined ADCs., , и . ISCAS (5), стр. 4831-4834. IEEE, (2005)An SoC compatible linearity test approach for precision ADCs using easy-to-generate sinusoidal stimuli., , , и . ISCAS (1), стр. 928-931. IEEE, (2004)A low-voltage compatible two-stage amplifier with ≥120 dB gain in standard digital CMOS., , и . ISCAS (1), стр. 353-356. IEEE, (2003)Testing high resolution ADCs using deterministic dynamic element matching., , , и . ISCAS (1), стр. 920-923. IEEE, (2004)Experimental evaluation and validation of a BIST algorithm for characterization of A/D converter performance., , , , , и . ISCAS (5), стр. 537-540. IEEE, (2003)High resolution ADC spectral test with known impure source and non-coherent sampling., , и . ISCAS, стр. 2674-2677. IEEE, (2013)