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Worst-case Power Integrity Prediction Using Convolutional Neural Network.

X. Dong, Y. Chen, J. Chen, Y. Wang, J. Li, T. Ni, Z. Shi, X. Yin, and C. Zhuo. ACM Trans. Design Autom. Electr. Syst., 28 (4): 54:1-54:19 (July 2023)

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Ying Ni

Pedestrian safety at urban signalised intersectionsY. Ni. TU Darmstadt, (2009)

Yi Ni

Ji Ni

Xiaoju Ni

Jianbing Ni

Other publications of authors with the same name

LCHR-TSV: Novel Low Cost and Highly Repairable Honeycomb-Based TSV Redundancy Architecture for Clustered Faults.T. Ni, Y. Yao, H. Chang, L. Lu, H. Liang, A. Yan, Z. Huang, and X. Wen. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 39 (10): 2938-2951 (2020)Design of True Random Number Generator Based on Multi-Stage Feedback Ring Oscillator.J. Cui, M. Yi, D. Cao, L. Yao, X. Wang, H. Liang, Z. Huang, H. Qi, T. Ni, and Y. Lu. IEEE Trans. Circuits Syst. II Express Briefs, 69 (3): 1752-1756 (2022)Fortune: A New Fault-Tolerance TSV Configuration in Router-Based Redundancy Structure.Q. Xu, H. Geng, T. Ni, S. Chen, B. Yu, Y. Kang, and X. Wen. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 41 (10): 3182-3187 (2022)SCLCRL: Shuttling C-elements based Low-Cost and Robust Latch Design Protected against Triple Node Upsets in Harsh Radiation Environments.A. Yan, Z. Li, S. Huang, Z. Zhai, X. Cheng, J. Cui, T. Ni, X. Wen, and P. Girard. DATE, page 1257-1262. IEEE, (2022)A novel in-field TSV repair method for latent faults.T. Ni, H. Chang, H. Qi, and Z. Huang. IEICE Electron. Express, 15 (23): 20180873 (2018)A 4NU-Recoverable and HIS-Insensitive Latch Design for Highly Robust Computing in Harsh Radiation Environments.A. Yan, A. Cao, Z. Fan, Z. Xu, T. Ni, P. Girard, and X. Wen. ACM Great Lakes Symposium on VLSI, page 301-306. ACM, (2021)MRCO: A Multi-ring Convergence Oscillator-based High-Efficiency True Random Number Generator.T. Ni, Q. Peng, J. Bian, L. Yao, Z. Huang, A. Yan, and X. Wen. AsianHOST, page 1-6. IEEE, (2022)A Test Method for Large-size TSV Considering Resistive Open Fault and Leakage Fault Coexistence.C. Hao, X. Yong, and T. Ni. VLSI-DAT, page 1-4. IEEE, (2021)A Robust and High-Performance Flip-Flop with Complete Soft-Error Recovery.A. Yan, X. Li, T. Ni, Z. Huang, and X. Wen. DSA, page 474-476. IEEE, (2023)A Sextuple Cross-Coupled Dual-Interlocked-Storage-Cell based Multiple-Node-Upset Self-Recoverable Latch.A. Yan, K. Qian, J. Cui, N. Cui, T. Ni, Z. Huang, and X. Wen. NANOARCH, page 1-6. IEEE, (2021)

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Disambiguation of "Ni, Tianming"

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Worst-case Power Integrity Prediction Using Convolutional Neural Network.

Please choose a person to relate this publication to

Ying Ni

Yi Ni

Ji Ni

Xiaoju Ni

Jianbing Ni

Other publications of authors with the same name

Disambiguation

BibSonomy

Disambiguation of "Ni, Tianming"

copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML Worst-case Power Integrity Prediction Using Convolutional Neural Network.

Please choose a person to relate this publication to

Ying Ni

Yi Ni

Ji Ni

Xiaoju Ni

Jianbing Ni

Other publications of authors with the same name

Disambiguation

copy delete add this publication to your clipboard
community post
history of this post
URL
DOI
BibTeX
EndNote
APA
Chicago
DIN 1505
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Worst-case Power Integrity Prediction Using Convolutional Neural Network.