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Test time reduction in analogue/mixed-signal devices by defect oriented testing: An industrial example., , , , , , и . DATE, стр. 371-376. IEEE, (2011)Error-Resilient Test Data Compression Using Tunstall Codes., , и . DFT, стр. 316-323. IEEE Computer Society, (2004)Defect Oriented Testing for analog/mixed-signal devices., , , , , , и . ITC, стр. 1-10. IEEE Computer Society, (2011)Two dimensional reordering of functional test data for compression by ATE., и . ACM Great Lakes Symposium on VLSI, стр. 188-192. ACM, (2005)Modeling and Evaluating Errors Due to Random Clock Shifts in Quantum-Dot Cellular Automata Circuits., , , , , , и . J. Electron. Test., 25 (1): 55-66 (2009)Hybrid Multisite Testing at Manufacturing., , , и . ITC, стр. 927-936. IEEE Computer Society, (2003)Test Time Reduction in a Manufacturing Environment by Combining BIST and ATE., , и . DFT, стр. 186-194. IEEE Computer Society, (2002)A Novel Methodology for Functional Test Data Compression., и . DFT, стр. 128-135. IEEE Computer Society, (2006)Improving Error Resilience for Compressed Test Sets by Don't Care Assignment., и . SoCC, стр. 65-68. IEEE, (2005)Fast and Robust LRSD-Based SAR/ISAR Imaging and Decomposition., , , , и . IEEE Trans. Geosci. Remote. Sens., (2022)