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Nominality Score Conditioned Time Series Anomaly Detection by Point/Sequential Reconstruction., , , , and . CoRR, (2023)Semiconductor wafer representation for TCAD., , , , , , , , , and 2 other author(s). IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 13 (1): 82-95 (1994)The Effects of Process Variations and BTI in Packaged FinFET Devices., , and . IRPS, page 1-5. IEEE, (2023)A 12b 50MS/s 2.1mW SAR ADC with redundancy and digital background calibration., , and . ESSCIRC, page 109-112. IEEE, (2013)NeurOLight: A Physics-Agnostic Neural Operator Enabling Parametric Photonic Device Simulation., , , , , , and . NeurIPS, (2022)Robust Deep Reinforcement Learning against Adversarial Perturbations on State Observations., , , , , , and . NeurIPS, (2020)Towards Stable and Efficient Training of Verifiably Robust Neural Networks., , , , , , , and . ICLR, OpenReview.net, (2020)Linking TCAD to EDA - Benefits and Issues., , , , , and . DAC, page 573-578. ACM, (1991)The intertool profile interchange format: an object-oriented approach semiconductor technology CAD/CAM., , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 10 (9): 1150-1156 (1991)Redundancy in SAR ADCs., , and . ACM Great Lakes Symposium on VLSI, page 283-288. ACM, (2011)