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Другие публикации лиц с тем же именем

Runtime Variability Monitor for Data Retention Characteristics of Commercial NAND Flash Memory., , и . IRPS, стр. 1-5. IEEE, (2021)Technology scaling effects on SRAM-PUF reliability under ionizing radiation., , и . DRC, стр. 1-2. IEEE, (2023)Redefining the Operation and Design Considerations of Organic Solar Cells: Role of Morphology and Defect States. Purdue University, USA, (2013)Exploiting DRAM Latency Variations for Generating True Random Numbers., , , , и . ICCE, стр. 1-6. IEEE, (2019)Radiation Tolerance of 3-D NAND Flash Based Neuromorphic Computing System., , , и . IRPS, стр. 1-4. IEEE, (2020)Tolerance of Deep Neural Network Against the Bit Error Rate of NAND Flash Memory., и . IRPS, стр. 1-4. IEEE, (2019)Flashmark: Watermarking of NOR Flash Memories for Counterfeit Detection., , и . DAC, стр. 1-6. IEEE, (2020)Machine Learning Assisted Accurate Estimation of Usage Duration and Manufacturer for Recycled and Counterfeit Flash Memory Detection., , , и . ATS, стр. 49-54. IEEE, (2019)Wireless Passive Radiation Dosimeter Using Flash Memory., и . WiSEE, стр. 239-245. IEEE, (2018)Towards the Avoidance of Counterfeit Memory: Identifying the DRAM Origin., , , , и . HOST, стр. 111-121. IEEE, (2020)