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Hard-to-Detect Fault Analysis in FinFET SRAMs.

, , , , , и . IEEE Trans. Very Large Scale Integr. Syst., 29 (6): 1271-1284 (2021)

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Said Hamdioui

Said Es-Said

Said Al-Said

Khaled Walid Saidavi

Jamal Rashid Said

 

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