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Threshold Voltage Instability in D-mode AlGaN/GaN MIS-HEMTs with Al2O3 Gate Dielectric.

Y. Liang, Y. Zhang, Y. Cai, Z. Wang, Y. Zhao, H. Wen, and W. Liu. ICICDT, page 1-4. IEEE, (2021)

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Wen Liu

Tung-wen Liu

Wen-Chao Liu

Other publications of authors with the same name

A Wideband Folded Reflectarray Antenna Based on Single-Layered Polarization Rotating Metasurface.W. Su, W. Luo, Z. Nie, W. Liu, Z. Cao, and Z. Wang. IEEE Access, (2020)High Throughput Low Complexity and Low Power ePiBM RS Decoder Using Fractional Folding.W. Liu, M. Lin, J. Shi, Q. Lin, G. Wang, P. Wang, and H. Liu. IEEE Trans. Circuits Syst. II Express Briefs, 68 (8): 2830-2834 (2021)Constructing Designated-Verifier Ring Signature and Ring Signcryption under the k-CCA2 Assumption.X. Fu, and W. Liu. INCoS, page 668-670. IEEE, (2012)Research on Urban Spatial Information Extraction and Land Use Analysis.W. Liu, Q. Zhong, J. Luo, and Z. Shen. IGARSS (2), page 859-862. IEEE, (2008)Wake-up-word spotting using end-to-end deep neural network system.S. Zhang, W. Liu, and Y. Qin. ICPR, page 2878-2883. IEEE, (2016)Stripe Noise Correction for Infrared Imaging System Using Neural Network Theory.J. Bai, C. Chang, and W. Liu. CSA/CUTE, volume 474 of Lecture Notes in Electrical Engineering, page 677-682. Springer, (2017)Cap layer and multi-work-function tuning impact on TDDB/BTI in SOI FinFET devices.W. Liu, A. Kerber, F. Guarin, and C. Ortolland. IRPS, page 2. IEEE, (2018)Crack Propagation and Fracture Process Zone (FPZ) of Wood in the Longitudinal Direction Determined Using Digital Image Correlation (DIC) Technique.Y. Yu, W. Zeng, W. Liu, H. Zhang, and X. Wang. Remote Sensing, 11 (13): 1562 (2019)The asymptotic equipartition property for Mth-order nonhomogeneous Markov information sources.W. Yang, and W. Liu. IEEE Trans. Inf. Theory, 50 (12): 3326-3330 (2004)Strong law of large numbers and Shannon-McMillan theorem for Markov chain fields on trees.W. Yang, and W. Liu. IEEE Trans. Inf. Theory, 48 (1): 313-318 (2002)

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Disambiguation of "Liu, Wen"

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Threshold Voltage Instability in D-mode AlGaN/GaN MIS-HEMTs with Al2O3 Gate Dielectric.

Please choose a person to relate this publication to

Wen Liu

Tung-wen Liu

Wen-Chao Liu

Wen-Chao Liu

Wen-Chao Liu

Other publications of authors with the same name

Disambiguation

BibSonomy

Disambiguation of "Liu, Wen"

copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML Threshold Voltage Instability in D-mode AlGaN/GaN MIS-HEMTs with Al2O3 Gate Dielectric.

Please choose a person to relate this publication to

Wen Liu

Tung-wen Liu

Wen-Chao Liu

Wen-Chao Liu

Wen-Chao Liu

Other publications of authors with the same name

Disambiguation

copy delete add this publication to your clipboard
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history of this post
URL
DOI
BibTeX
EndNote
APA
Chicago
DIN 1505
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Threshold Voltage Instability in D-mode AlGaN/GaN MIS-HEMTs with Al2O3 Gate Dielectric.