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Self-Testing in Bit Serial VLSI Parts: High Coverage at Low Cost., , and . ITC, page 260-268. IEEE Computer Society, (1983)Poisson distributed noise generation for spiking neural applications., , , , , and . ISCAS, page 365-368. IEEE, (2010)Adaptation of barn owl localization system with spike timing dependent plasticity., , , and . IJCNN, page 155-160. IEEE, (2008)Rapid evaluation and evolution of neural models using graphics card hardware., , , , and . GECCO, page 299-306. ACM, (2008)Synaptic weight noise during multilayer perceptron training: fault tolerance and training improvements., and . IEEE Trans. Neural Networks, 4 (4): 722-725 (1993)A sensor system on chip for wireless microsystems., , , , , , , , , and 3 other author(s). ISCAS, IEEE, (2006)Low cost, patterning of human hNT brain cells on parylene-C with UV & IR laser machining., , , , , , , , , and 1 other author(s). EMBC, page 862-865. IEEE, (2013)Bit-Serial Neural Networks., , and . NIPS, page 573-583. American Institue of Physics, (1987)Citcuits for VLSI Implementation of Temporally Asymmetric Hebbian Learning., , and . NIPS, page 1091-1098. MIT Press, (2001)Synaptic Weight Noise During MLP Learning Enhances Fault-Tolerance, Generalization and Learning Trajectory., and . NIPS, page 491-498. Morgan Kaufmann, (1992)