( en | de | ru )

 

Disambiguation of "Wheater, Donald L."

Author of the publication

copydeleteadd this publication to your clipboard
The Series/1 as a Test System Controller for System Verification and Calibration.

, and . ITC, page 377-380. IEEE Computer Society, (1981)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

Donald L Ehresmann

Donald Preuss

Donald Doenges

Donald Becker

Donald Ipperciel

 

Other publications of authors with the same name

Test Trade-Offs Take Center Stage at ITC., and . IEEE Des. Test Comput., 18 (5): 59- (2001)An On-Chip Self-Repair Calculation and Fusing Methodology., , , , , , and . IEEE Des. Test Comput., 20 (5): 67-75 (2003)A Successful DFT Tester: What Will It Look Like? Is Revolution in Test Approaches Required?, , , and . VTS, page 87-90. IEEE Computer Society, (2002)Low Cost Testing of High Density Logic Components., , , , , , , and . ITC, page 550-557. IEEE Computer Society, (1989)On-Chip Repair and an ATE Independent Fusing Methodology., , , , , and . ITC, page 178-186. IEEE Computer Society, (2002)The Series/1 as a Test System Controller for System Verification and Calibration., and . ITC, page 377-380. IEEE Computer Society, (1981)IBM's Cost Performance Array Tester Architecture for the 80's.. ITC, page 466-470. IEEE Computer Society, (1984)Guest Editors' Introduction: Stressing the Fundamentals., and . IEEE Des. Test Comput., 19 (5): 54-55 (2002)ATE-Customer Perspectives & Requirements Panel.. ITC, page 1298. IEEE Computer Society, (2003)A SmartBIST Variant with Guaranteed Encoding., , , , , and . Asian Test Symposium, page 325-. IEEE Computer Society, (2001)