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A Sextuple Cross-Coupled SRAM Cell Protected against Double-Node Upsets.

A. Yan, Y. Chen, J. Zhou, J. Cui, T. Ni, X. Wen, and P. Girard. ATS, page 1-5. IEEE, (2020)

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Benoît Girard

Jules Girard

Pierre Girard

Adrien Girard

Yann Girard

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Low-energy BIST design: impact of the LFSR TPG parameters on the weighted switching activity.P. Girard, L. Guiller, C. Landrault, S. Pravossoudovitch, J. Figueras, S. Manich, J. Teixeira, and M. Santos. ISCAS (1), page 110-113. IEEE, (1999)Effect-cause intra-cell diagnosis at transistor level.Z. Sun, A. Bosio, L. Dilillo, P. Girard, A. Todri, A. Virazel, and E. Auvray. ISQED, page 460-467. IEEE, (2013)Structural-Based Power-Aware Assignment of Don't Cares for Peak Power Reduction during Scan Testing.N. Badereddine, P. Girard, S. Pravossoudovitch, C. Landrault, A. Virazel, and H. Wunderlich. VLSI-SoC, page 403-408. IEEE, (2006)Energy Model based Control for Forming Processes.P. Girard, and V. Thomson. ICINCO-ICSO, page 51-59. INSTICC Press, (2008)Example-based programming: a pertinent visual approach for learning to program.N. Guibert, P. Girard, and L. Guittet. AVI, page 358-361. ACM Press, (2004)Validation d'une approche " basée sur exemples " pour l'apprentissage de la programmation.N. Guibert, L. Guittet, and P. Girard. IHM, volume 264 of ACM International Conference Proceeding Series, page 147-154. ACM, (2005)Design of a Sextuple Cross-Coupled SRAM Cell with Optimized Access Operations for Highly Reliable Terrestrial Applications.A. Yan, Z. Wu, J. Zhou, Y. Hu, Y. Chen, Z. Ying, X. Wen, and P. Girard. ATS, page 55-60. IEEE, (2019)Designs of Two Quadruple-Node-Upset Self-Recoverable Latches for Highly Robust Computing in Harsh Radiation Environments.A. Yan, Z. Li, J. Cui, Z. Huang, T. Ni, P. Girard, and X. Wen. IEEE Trans. Aerosp. Electron. Syst., 59 (3): 2885-2897 (June 2023)A Low Overhead and Double-Node-Upset Self-Recoverable Latch.A. Yan, F. Xia, T. Ni, J. Cui, Z. Huang, P. Girard, and X. Wen. ITC-Asia, page 1-5. IEEE, (2023)Cost-Optimized and Robust Latch Hardened against Quadruple Node Upsets for Nanoscale CMOS.A. Yan, S. Song, J. Zhang, J. Cui, Z. Huang, T. Ni, X. Wen, and P. Girard. ITC-Asia, page 73-78. IEEE, (2022)

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Disambiguation of "Girard, Patrick"

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A Sextuple Cross-Coupled SRAM Cell Protected against Double-Node Upsets.

Please choose a person to relate this publication to

Benoît Girard

Jules Girard

Pierre Girard

Adrien Girard

Yann Girard

Other publications of authors with the same name

Disambiguation

BibSonomy

Disambiguation of "Girard, Patrick"

copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML A Sextuple Cross-Coupled SRAM Cell Protected against Double-Node Upsets.

Please choose a person to relate this publication to

Benoît Girard

Jules Girard

Pierre Girard

Adrien Girard

Yann Girard

Other publications of authors with the same name

Disambiguation

copy delete add this publication to your clipboard
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URL
DOI
BibTeX
EndNote
APA
Chicago
DIN 1505
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MSOffice XML

A Sextuple Cross-Coupled SRAM Cell Protected against Double-Node Upsets.