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Towards a Smart Multi-Sensor Ionizing Radiation Monitoring System., , , , , , , , , and 8 other author(s). DSD, page 286-293. IEEE, (2023)Automatic and reliable electrical characterization of MOSFETs., , and . DDECS, page 262-265. IEEE Computer Society, (2014)A design concept for radiation hardened RADFET readout system for space applications., , , , , , , , , and 4 other author(s). Microprocess. Microsystems, (April 2022)Simulation-Based Analysis of the Single Event Transient Response of a Single Event Latchup Protection Switch., , , , and . DDECS, page 255-258. IEEE Computer Society, (2015)Response of Commercial P-Channel Power VDMOS Transistors to Ionizing Irradiation and Bias Temperature Stress., , , , , , , , , and 4 other author(s). J. Circuits Syst. Comput., 31 (18): 2240003:1-2240003:25 (December 2022)Floating-Gate MOS Transistor with Dynamic Biasing as a Radiation Sensor., , , and . Sensors, 20 (11): 3329 (2020)SET response of a SEL protection switch for 130 and 250 nm CMOS technologies., , , , , and . IOLTS, page 185-190. IEEE, (2016)Design of Radiation Hardened RADFET Readout System for Space Applications., , , , , , , , , and 4 other author(s). DSD, page 484-488. IEEE, (2020)